Method for manufacturing to-be-measured film for infrared analysis and method for measuring Fc, Ec and Et
An infrared analysis and flake technology, which is used in the preparation of test samples and the measurement of color/spectral characteristics.
Active Publication Date: 2013-01-16
CHNA ENERGY INVESTMENT CORP LTD +2
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[0003] The present invention aims to provide a method for preparing a thin slice to be tested for infrared analysis and a method for measuring Fc, Ec and Et, so as to solve the problem of inaccurate results of measuring Fc, Ec and Et by infrared spectroscopy in the prior art
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preparation example Construction
[0016] In a typical embodiment of the present invention, a method for preparing a thin film to be tested for infrared analysis is provided, the preparation method comprising the following steps: S1, performing two compressions on the impact copolymer to form a thin film; S2, The flakes were cooled to room temperature within 2-5 minutes to form flakes to be tested.
[0017] The impact copolymer was tableted twice with a tablet machine. During the tableting process, the crystal form of the copolymer molecules was arranged irregularly, and then the sheet was cooled to room temperature within 2 to 5 minutes by rapid cooling, thereby obtaining The surface of the thin film to be tested is smooth, no spots appear and is in a translucent state, and the crystal form of the copolymer molecules inside remains irregularly arranged, so that when using it to determine Fc, Ec and Et, the reproducibility of the data can be better, The test results are relatively accurate and can accurately an...
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The invention provides a method for manufacturing a to-be-measured film for infrared analysis and a method for measuring Fc, Ec and Et. The method for manufacturing the to-be-measured film includes steps of S1, sheeting an impact-resistant copolymer twice to form a film; and S2, cooling the film so that the temperature of the film is reduced to the room temperature within 2-5 minutes to form the to-be-measured film. The impact-resistant copolymer is sheeted twice by a sheet press, crystal forms of molecules of the copolymer are irregularly arranged in sheeting processes, and then the temperature of the film is reduced to the room temperature within 2-5 minutes by means of quick cooling, so that the surface of the obtained to-be-measured film is smooth, the to-be-measured film does not have specks and is semi-transparent, and the crystal forms of the molecules of the copolymer in the to-be-measured film keep arranged irregularly. Accordingly, when the to-be-measured film is used for measuring the Fc, the Ec and the Et, data reproducibility is good, test results are accurate, and technological conditions can be accurately and timely reflected.
Description
technical field [0001] The invention relates to the production field of copolymers, in particular to a method for preparing a thin slice to be tested for infrared analysis and a method for measuring Fc, Ec and Et. Background technique [0002] In the production process of impact copolymer, Fc (content of rubber phase in impact copolymer), Ec (content of monomer in rubber phase of impact copolymer) and Et (content of monomer in impact copolymer) ) is very important to the monitoring of products. Through the monitoring of data, the process can be quickly adjusted to improve product quality and avoid production accidents. At present, the infrared method is generally used to measure the compression of the impact copolymer, measure the band intensity or band area, and use the calculation method of the first order derivative and the second order derivative of the band to calculate the Fc and Ec in the impact copolymer. and Et values, however, the current analysis methods for Fc, ...
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IPC IPC(8): G01N1/28G01N21/25
Inventor 王玉辉刘国圣张大伟周丛
Owner CHNA ENERGY INVESTMENT CORP LTD