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Method and device for selecting test points of artificial electromagnetic material unit

An artificial electromagnetic material and test point technology, applied in the field of metamaterials, can solve the problem of consuming large resources, and achieve the effects of ensuring uniformity, optimizing test design, and saving test resources.

Active Publication Date: 2015-04-29
KUANG CHI INST OF ADVANCED TECH +1
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

Too many test points can consume a lot of resources

Method used

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  • Method and device for selecting test points of artificial electromagnetic material unit
  • Method and device for selecting test points of artificial electromagnetic material unit
  • Method and device for selecting test points of artificial electromagnetic material unit

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Embodiment Construction

[0023] Embodiments of the present invention provide a method and device for selecting test points of an artificial electromagnetic material unit. Each will be described in detail below.

[0024] The flow chart of the test point selection method of a kind of artificial electromagnetic material unit in embodiment 1 of the present invention can refer to figure 2 , the method includes: …

[0025] Step 101, acquiring the parameters of the artificial electromagnetic material unit to be tested, the value range and parameter level of the parameters.

[0026] For example, the geometric parameters are selected as (a, b), and the value ranges of each parameter are [0.25, 1], [0.25, 1] ​​respectively. The value levels of each parameter are 4 and 4 respectively.

[0027] Step 102, according to the parameters of the artificial electromagnetic material unit, the value range of the parameters and the parameter level, calculate the test point sequence through the hyper-Latin design method....

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Abstract

The embodiment of the invention provides a method and a device for selecting test points of an artificial electromagnetic material unit. The method comprises the following steps: acquiring parameters of a to-be-measured artificial electromagnetic material unit, a value range of the parameters and a parameter level; and according to the parameters of the artificial electromagnetic material unit, the value range of the parameters and the parameter level, calculating a test point sequence with the Hyper-Latin design method and selecting test points of the artificial electromagnetic material unit instructed by the test point sequence. The method and the device of the embodiment of the invention can be used to complete a test by selecting fewer test points, so that the number of the selected test points is reduced, the test resources are saved, and a test design is optimized.

Description

technical field [0001] The invention relates to the field of metamaterials, in particular to a method and device for selecting test points of an artificial electromagnetic material unit. Background technique [0002] With the development of metamaterial technology, the description of the electromagnetic properties of the structural units of artificial electromagnetic materials plays a vital role in the automatic design of artificial electromagnetic materials. Measuring the electromagnetic properties of structural units of artificial electromagnetic materials is an important part of the design process In the link, the shape and size of the artificial electromagnetic material will affect its electromagnetic properties. Therefore, in the process of measuring the electromagnetic properties of the artificial electromagnetic material unit, it is necessary to select a large number of test points for testing. [0003] At present, the test point selection method of the artificial mat...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00
Inventor 刘若鹏刘斌栾琳
Owner KUANG CHI INST OF ADVANCED TECH
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