Method for acquiring phase position of fast bright reflection surface on basis of color stripe permutation projection
A surface phase and color fringe technology, which is applied to measuring devices, instruments, and optical devices, etc., can solve the problem that the phase calculation cannot be completed in three-dimensional topography, and achieve the effect of high speed, speed and reliability, and low cost
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[0030] See figure 1 , the present invention is based on a color fringe combined projection fast strong reflection surface phase solution method, characterized in that: comprising the following steps:
[0031] (1) Set exposure array T={T i},i=1,2,...,n;
[0032] Wherein, the exposure array T includes a plurality of exposure times, totaling n, arranged in order from short to long.
[0033] (2) Use a projector to project red, green, and blue monochromatic lights with grayscale values of A+B;
[0034] Wherein, the gray value A+B mentioned above generally ranges from 0 to 255 for common commercial projection equipment.
[0035] (3) Adjust the camera exposure time so that it is at T i ,i=1,...,n exposure time respectively shoot the red, green and blue monochromatic light projected by the projector, and obtain the monochromatic image array PR={PR i},i=1,2,...,n, PG={PG i},i=1,2,...,n, PB={PB i},i=1,2,...,n;
[0036](4) Use a projector to project red, green, and blue monochr...
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