Test device applicable to height indicator simulation test

Abstract

The invention relates to the field of aircraft ground test, and discloses a test device applicable to height indicator simulation test. The test device comprises a simulation signal generation circuit, wherein the simulation signal generation circuit comprises a voltage sharing circuit and a voltage stabilizing circuit; the voltage stabilizing circuit comprises a diode circuit and an impedance circuit which is in circuit connection with the diode circuit in parallel; the input end of the voltage sharing circuit is in circuit connection with an external power input; the output end of the voltage sharing circuit is in circuit connection with the input end of the voltage stabilizing circuit; and the output end of the voltage stylizing circuit externally outputs an simulation current signal for the height indicator simulation test. By the technical scheme, during the height indicator simulation test, the precision of the simulation signal can be improved, and the flexibility and the practicability of the test device are improved.

Description

technical field [0001] The invention relates to the field of aviation ground tests, in particular to a test device suitable for altimeter simulation tests. Background technique [0002] In the process of aircraft production and maintenance, it is necessary to conduct an altimeter simulation test on the aircraft's airborne altimeter. The purpose is to detect the corresponding cross-linking function of the altimeter itself and its automatic flight control system at a certain simulated altitude. Is it working properly. The test method is as follows: input an analog signal to the radio altimeter transceiver of the aircraft, and the transceiver transmits the analog signal to the altimeter indicator and the automatic flight control system computer connected with it. According to the simulated altitude indicated by the indicator, the test personnel can check whether the aircraft altimeter works normally. It is also possible to check whether the functions such as the go-around mod...

AI Technical Summary

Problems solved by technology

Due to the small variation range of the resistance value of the variable resistor, the error of the analog signal is large, and due to the large resistance of the Zener diode, a part of the voltage of the analog signal will be divided, so the analog signal cannot reach 0V, and the corresponding height Often more than ten meters, it cannot simulate the height of zero, and the accuracy is poor

In addition, the test device lacks a control and monitoring system, cannot stop or start the test device as required, and cannot monitor the analog signal output by the test device, monitor the voltage value or corresponding height of the signal, poor flexibility and practicability

Images