Array Test Set
A technology for array testing and moving devices, applied in the direction of measuring devices, single semiconductor device testing, measuring electricity, etc., can solve the problem that the guide member 234 cannot be extended, and achieve the effect of increasing the length and reducing the overall size
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0031] A preferred embodiment of the array testing device according to the present invention will be described in detail below with reference to the accompanying drawings.
[0032] like Figure 5As shown, the array testing device according to the present invention includes a base frame 10, a loading unit 30 for loading a glass panel P onto the device, a testing unit 20 for testing the glass panel P loaded by the loading unit 30, and a 20 The tested glass panel P is unloaded from the device unloading unit 40.
[0033] The testing unit 20 tests the glass panel P for electrical defects. The test unit 20 includes a light-transmitting support plate 21 , a test module 22 , a probe assembly 23 and a control unit (not shown). The glass panel P loaded by the loading unit 30 is placed on the light-transmitting support plate 21 . The testing module 22 tests electrical defects of the glass panel P placed on the light-transmitting support plate 21 . The probe assembly 23 applies electr...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 