Temperature controller evening temperature in force and adjusting temperature by semiconductor chilling plates and used for testing inertia type instrument

Abstract

A temperature controller evening temperature in force and adjusting temperature by semiconductor chilling plates and used for testing an inertia type instrument comprises a temperature controller (100), a control and power amplifying circuit (200), a thermostatic container (300) and a temperature sensor (400). The thermostatic container (300) comprises temperature adjusting elements and even temperature bodies (304). The temperature adjusting elements are installed outside the thermostatic container (300), and evening of the temperature is initially carried out through an outer shell of the container (300). Tested objects are contained by adoption of the even temperature bodies (304) to achieve evening of the temperature for the second time. By controlling of currents of the temperature adjusting elements, tiny differences between the upper and the lower portions of the thermostatic container (300) are formed. Thus, mediums in the thermostatic container (300) are forced to flow up and down. Meanwhile, baffle-flow plates (308) are arranged horizontally in the path where the mediums flow up and down, so that the mediums rotate, and conduction and convection are strengthened. The temperature controller evening temperature in force and adjusting temperature by semiconductor chilling plates and used for testing the inertia type instrument has the advantages of being compact in the structure, capable of enabling the measured objects to be even in temperature, quick in response, small in temperature adjusting power, high in precision of controlling temperature, and small in interference generated when passing through a power source.

Description

technical field [0001] The invention relates to a temperature control device for inertial instrument testing. Background technique [0002] The measurement and control of temperature is a broad field, which is widely used in scientific research, production and life. The measurement of inertial instruments (gyroscopes, accelerometers) has high requirements for temperature control. It not only requires high temperature control accuracy, but also requires long-term stability of temperature control accuracy and temperature uniformity of the same batch of instruments under test. . [0003] The temperature controllers of gyroscopes and quartz watches, which are often used in scientific research and production, leave a large space for uniform internal temperature distribution. The heating device adopts a specially designed constantan resistor with high heating power. The general voltage is 24-28V, and the current 1-2 circuits, each 1.5-2A, the temperature control accuracy is up t...

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Problems solved by technology

[0003] The temperature controllers of gyroscopes and quartz watches, which are often used in scientific research and production, leave a large space for uniform internal temperature distribution. The heating device adopts a specially designed constantan resistor with high heating power. The general voltage is 24-28V, and the current 1-2 circuits, each 1.5-2A, the temperature control accuracy is up to T±0.1℃, the long-term stability is difficult to guarantee, and the internal uniformity is also lacking.

If the air inside the container can be made to flow, the temperature distribution can be made uniform, but such as built-in fans, electrical interference and vibration interference are not allowed by sensitive inertial devices, if compressed air is blown in from the outside to promote air or liquid Flow, the temperature of the compressed air blown in is difficult to control to the required accuracy

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