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Illuminating system for microscope and corresponding method

A lighting system and microscope technology, applied in microscopes, instruments, optics, etc., can solve the problems of rarely implementing GSDIM microscopes and having little meaning

Active Publication Date: 2013-06-05
LEICA MICROSYSTEMS CMS GMBH
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Problems solved by technology

[0011] The above-mentioned known method of switching from TIRF illumination to GSDIM illumination has the advantage of relative simplicity, since it is achieved by inserting the telescope, but also has the disadvantage that GSDIM is rarely performed under TIRF conditions, i.e. when the scanning mirror 12 is in a tilted position. microscope
More importantly, TIRF itself is a rarely used application, so combining it with GSDIM microscopy makes little sense

Method used

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  • Illuminating system for microscope and corresponding method
  • Illuminating system for microscope and corresponding method
  • Illuminating system for microscope and corresponding method

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Embodiment Construction

[0041] attached Figure 1a and 1b The design and principle of operation of the lighting unit shown in is described in detail in the introductory part of the specification.

[0042] In FIG. 2 , an embodiment of a microscope illumination system according to the invention is only schematically shown. In particular, with Figure 2a A microscope illumination unit 100 for a confocal microscope is shown, with Figure 2b The modification of the microscope illumination unit 100 for the GSDIM method is shown. In both figures, the illumination beam 16 originates from a light source 32 (typically a laser or other point-like light source) and propagates initially bottom-up. The light is collimated by the collimator 31 . In the following it is assumed that the wavelength of the laser beam is suitable for causing fluorescence emission in the stained sample 8 .

[0043] attached Figure 2a Among them, in addition to the light source 32 and the collimating optics 31, the illumination sou...

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Abstract

The microscope illumination system has illumination source (10) for generating illuminating beam path (16) running parallel to optical axis (9). A scan mirror deflects illumination beam path in plane perpendicular to optical axis. A scan eye piece and downstream scan tube lens are provided for imaging scanning mirror in back focal plane (6) of microscope objective (7) and for expanding illumination beam path. A microscope illumination unit has focusing lens for localization microscopy that is provided in illumination beam path in back focal plane of microscope objective. An independent claim is included for a method for switching between confocal and non-confocal microscope lighting type with microscope illumination unit.

Description

technical field [0001] The invention relates to a microscope illumination system and provides a corresponding method for positioning the microscope illumination of a microscope, the invention in particular allows switching to different illumination modes for scanning microscopes, in particular for confocal microscopes. Background technique [0002] The present invention relates to the technical implementation of a super-resolution localization microscopy method. This method is characterized in that only a few object points simultaneously emit light at a given time when the image is acquired. If the spacing between these points is significantly greater than the optical resolution, the position of these points can be determined by mathematical centroid determination with a precision higher than the optical resolution of the objective used. Summing individual images of many different object points eventually yields a super-resolution image of the entire object. Known variants...

Claims

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Application Information

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IPC IPC(8): G02B21/08G02B21/00
CPCG02B27/58G02B21/16G02B21/0028G02B21/0076G02B21/06G02B21/367G02B21/0032
Inventor C·舒尔茨
Owner LEICA MICROSYSTEMS CMS GMBH
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