Simulation testing system of non-volatile memory (NVM) built-in self-testing circuit

A technology of built-in self-test circuit and simulation test, which is applied in the direction of static memory and instruments, can solve problems such as difficult debugging, failure to automatically detect the integrity of test vectors, and inability to provide test vectors for silicon wafer test machines, so as to ensure integrity The effect of reducing the workload of testing

Active Publication Date: 2013-06-05
SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The third is difficult to debug
The fourth is that it cannot provide test vectors for silicon wafer test machines
The fifth is that the integrity of the test vector cannot be automatically detected

Method used

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  • Simulation testing system of non-volatile memory (NVM) built-in self-testing circuit
  • Simulation testing system of non-volatile memory (NVM) built-in self-testing circuit

Examples

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Embodiment Construction

[0029] see figure 2 , which is a simulation test system of a NVM BIST circuit of the present invention. The system includes a test host 1 ; a plurality of analog modules 21 , 22 , 23 , . . . ; an NVM chip circuit 31 ; a BIST circuit 32 of NVM;

[0030] The BIST circuit 32 of the NVM is connected with the test host 1 , each analog module 21 , 22 , 23 , . . . , and the NVM chip circuit 31 . The test host 1 , a plurality of analog modules 21 , 22 , 23 , . . . and the NVM chip circuit 31 constitute the normal working environment of the BIST circuit 32 of the NVM.

[0031] The automatic detection module 4 is connected with the test host 1 , each analog module 21 , 22 , 23 , . . . , the NVM chip circuit 31 , and the BIST circuit 32 of the NVM. The automatic detection module 4 detects the connected modules, realizes data detection and timing detection, and can analyze and locate related problems.

[0032] Described automatic detection module 4 specifically comprises:

[0033] - ...

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Abstract

The invention discloses a simulation testing system of a non-volatile memory (NVM) built-in self-testing circuit. The simulation testing system of the NVM built-in self-testing circuit comprises a testing host computer, a plurality of simulation modules, an NVM chip circuit, the NVM built-in self-testing circuit, and an automatic detection module. The automatic detection module specifically comprises an interface signal detecting module, a system state detecting module, an instruction execution timing sequence detecting module, a test integrity detecting module, a data output module, and a test vector output module. According to the simulation testing system of the NVM built-in self test circuit, workload of detection of the NVM built-in self-testing circuit is greatly reduced, and integrity of a test is guaranteed.

Description

technical field [0001] The invention relates to a simulation test system of NVM (Non-Volatile Memory, non-volatile memory). Background technique [0002] The built-in self-test (Built-in Self Test, referred to as BIST) technology is to implant a circuit that provides a self-test function into the circuit design, so as to reduce the dependence of device testing on automatic test equipment (ATE). BIST technology can be applied to almost all circuits, so it is widely used in the semiconductor industry. [0003] For example, the BIST technology commonly used in NVM includes implanting test pattern generation circuits, sequential circuits, mode selection circuits, and debugging test circuits in NVM circuits, which are collectively referred to as BIST circuits. [0004] see figure 1 , which is an existing NVM BIST circuit simulation test system. The system includes a test host 1 ; a plurality of analog modules 21 , 22 , 23 , . . . ; an NVM chip circuit 31 ; and a BIST circuit 3...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/12
Inventor 雷冬梅赵锋张爱东
Owner SHANGHAI HUAHONG GRACE SEMICON MFG CORP
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