Unlock instant, AI-driven research and patent intelligence for your innovation.

Fan testing device

A fan test, fan technology, applied in pump test, liquid variable capacity machinery, machine/engine, etc., can solve the problems of high test cost, waste of resources, high price, etc.

Inactive Publication Date: 2013-06-19
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
View PDF0 Cites 14 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, computer motherboard systems are usually more expensive, which will result in higher testing costs. In addition, a complete computer motherboard system has many peripherals, most of which are not used during testing, resulting in a waste of resources.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Fan testing device
  • Fan testing device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0015] see figure 1 , the fan testing device 100 of the present invention is used to test the rotation speed of the six-pin fan 200 . The fan testing device 100 according to the preferred embodiment of the present invention includes a fan connector 10 , a single chip microcomputer 20 , a fan power supply control circuit 30 , a USB connector 40 , an LCD display module 50 and a power supply 60 . The fan connector 10 is used for connecting the fan 200 and the microcontroller 20 . The single chip microcomputer 20 is used to test the rotation speed of the fan 200 . The fan power supply control circuit 30 supplies power to or cuts off the fan 200 under the control of the microcontroller 20 . The power supply 60 is used to supply power to the microcontroller 20 , the USB connector 40 and the LCD display module 50 .

[0016] Please also refer to figure 2 , the fan connector 10 is connected to the fan 200 . The fan connector 10 is a six-pin fan connector, which includes a ground ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A fan testing device is used for testing the rotating speed of a fan. The fan testing device comprises a fan power source, a fan connector, a single chip microcomputer and a fan power supply control circuit. The single chip microcomputer sends a pulse width modulation control signal to the fan through the fan connector so as to control the rotating speed of the fan, and records a reference rotating speed corresponding to the pulse width modulation control signal. The single chip microcomputer also receives the actual rotating speed of the fan through the fan connector so as to compare the actual rotating speed and the reference rotating speed to see whether the actual rotating speed and the reference rotating speed are equal or whether the difference between the actual rotating speed and the reference rotating speed is in a specified error range. The fan power supply control circuit comprises a relay, wherein the relay is in electric connection with the fan power source and is in electric connection with the fan through the fan connector, and the relay is controlled by the single chip microcomputer to enable the fan power source to supply power to the fan or cut off the power supplied to the fan.

Description

technical field [0001] The invention relates to a testing device, in particular to a fan testing device for testing the rotating speed of a fan. Background technique [0002] When testing the cooling fan of a computer mainframe or a notebook computer, a complete computer motherboard system is generally used to carry out various tests. However, the computer motherboard system is usually more expensive, resulting in higher testing costs. In addition, a complete computer motherboard system has many peripherals, and most of the peripherals are not used during the test, resulting in a waste of resources. . Contents of the invention [0003] In view of the above problems, it is necessary to provide a fan testing device with simple structure and low price. [0004] A fan testing device is used for testing the rotating speed of a fan, and the fan testing device includes: [0005] fan power supply; [0006] a fan connector, electrically connected to the fan, and the fan connect...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): F04B51/00
Inventor 张万宏朱鸿儒
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More