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Monitoring system of standard semiconductor equipment based on organic photo conductor (OPC)

A monitoring system and semiconductor technology, applied in the direction of semiconductor/solid-state device testing/measurement, comprehensive factory control, comprehensive factory control, etc., can solve the problem of not being able to better meet the process requirements, general configuration software is expensive, and the interface elements are not rich enough and other issues, to achieve good visualization effects, good scalability, and easy operation

Inactive Publication Date: 2013-07-10
TSINGHUA UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] (1) General configuration software is generally expensive;
[0004] (2) The interface elements are not rich enough, and there are still some defects in the special processing of process data, which cannot better meet the process requirements;
[0005] (3) General configuration software requires users to make further edits according to their own needs, and users have to spend a lot of energy to configure the software before and during use, which is time-consuming and labor-intensive

Method used

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  • Monitoring system of standard semiconductor equipment based on organic photo conductor (OPC)
  • Monitoring system of standard semiconductor equipment based on organic photo conductor (OPC)
  • Monitoring system of standard semiconductor equipment based on organic photo conductor (OPC)

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Embodiment Construction

[0033] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention. On the contrary, the embodiments of the present invention include all changes, modifications and equivalents coming within the spirit and scope of the appended claims.

[0034] In the description of the present invention, it should be understood that the terms "first", "second" and so on are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance. In the description of the present invention, it should be noted that unless otherwise specified and limited, the terms "connected" and "connect...

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Abstract

The invention provides a monitoring system of standard semiconductor equipment based on an organic photo conductor (OPC). The monitoring system of the semiconductor equipment based on the OPC standard comprises lower computer sets and an upper computer. The lower computer sets are connected with the semiconductor equipment, and used for controlling operation of the semiconductor equipment and monitoring operating state and procedure parameters of the semiconductor equipment. The upper computer is connected with lower computer sets, and used for monitoring and managing the lower computer sets and acquiring state information and procedure parameters of the semiconductor equipment from the lower computer sets, and sending control instructions, a technical formula and technical parameters controlling operation of the semiconductor equipment to the lower computer sets. The monitoring system of the semiconductor equipment based on the OPC standard has the advantages of being safe and reliable, and convenient to operate. Besides, an unified mode is used to real time assess control the lower computer sets of each unit module of the semiconductor equipment, the lower computer sets are integrated, and unified management of each unit module and production dispatching of wafer machining are achieved.

Description

technical field [0001] The invention relates to the technical field of semiconductor equipment control, in particular to a monitoring system for semiconductor equipment based on the OPC standard. Background technique [0002] In order to ensure the safety and reliability of the operation of semiconductor equipment, maximize the operating efficiency of the system, and meet the operating needs of craftsmen, it is urgent to independently develop a set of upper-level monitoring systems that can monitor equipment in real time. At present, there are many ready-made general-purpose configuration software on the market that can be used to build upper-level monitoring system software, such as KingView and WINCC, etc., but there are some problems: [0003] (1) General configuration software is generally expensive; [0004] (2) The interface elements are not rich enough, and there are still some defects in the special processing of process data, which cannot better meet the process re...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B19/418H01L21/66
CPCY02P90/02
Inventor 路新春李弘恺田芳馨何永勇
Owner TSINGHUA UNIV
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