Monitoring system of standard semiconductor equipment based on organic photo conductor (OPC)
A monitoring system and semiconductor technology, applied in the direction of semiconductor/solid-state device testing/measurement, comprehensive factory control, comprehensive factory control, etc., can solve the problem of not being able to better meet the process requirements, general configuration software is expensive, and the interface elements are not rich enough and other issues, to achieve good visualization effects, good scalability, and easy operation
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[0033] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary only for explaining the present invention and should not be construed as limiting the present invention. On the contrary, the embodiments of the present invention include all changes, modifications and equivalents coming within the spirit and scope of the appended claims.
[0034] In the description of the present invention, it should be understood that the terms "first", "second" and so on are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance. In the description of the present invention, it should be noted that unless otherwise specified and limited, the terms "connected" and "connect...
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