LED flip-chip testing machine and testing method

A LED chip and chip testing technology, which is applied in the direction of single semiconductor device testing, etc., can solve the problems that cannot reflect the advantages and disadvantages of the flip-chip LED chip process, cannot provide the basis for light and color separation of test data, and flip-chip LED chips cannot provide objective and reliable testing. Data and other issues, to achieve high utilization, low equipment cost, high selectivity and flexibility

Inactive Publication Date: 2013-08-14
东莞市福地电子材料有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Flip-chip LED chip products are packaged by ultrasonic bonding or reflow soldering. Usually, the test results of packaged products are used as the basis for measuring the performance of flip-chip LED products. Such testing methods have a certain lag and cannot be objectively reflected in the chip stage. The advantages and disadvantages of the flip-chip LED chip process cannot provide test d

Method used

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  • LED flip-chip testing machine and testing method
  • LED flip-chip testing machine and testing method
  • LED flip-chip testing machine and testing method

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Embodiment Construction

[0026] Such as figure 1 Shown is a schematic diagram of the structure of a traditional front-mounted LED chip testing machine. A flip-chip LED chip testing machine created by the present invention is formed by refitting the traditional front-mounted LED chip testing machine. Such as Figure 2-5 Shown is the testing machine created by the present invention, the flip-chip LED chip testing machine includes a chip loading device, a chip testing device and a flat solar panel 11, the chip testing device includes a probe 9, the contact direction of the probe 9 is downward, and the probe The needle 9 is used to connect the electrode of the LED chip to be tested to make the LED chip emit light; the chip loading device includes a working disc 6 for placing the flip-chip LED chip 8 to be tested and an XYZ three-axis driving device 1, and a support is provided under the working disc 6 The working disk 6 is connected to the XYZ three-axis driving device 1 through the supporting part. The ...

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Abstract

The invention provides an LED flip-chip testing machine and a testing method, which can test an LED flip-chip timely at the chip stage of flipping the LED chip, wherein the provided testing data can be taken as a basis for light splitting and color separation, and can objectively reflect the LED chip flipping technology. The LED flip-chip testing machine comprises a support part, wherein a working plate is connected to an X-Y-Z triaxial driving device through the support part, and a gap capable of accommodating a plate-shaped solar panel is reserved between the working plate and the X-Y-Z triaxial driving device; and the working plate is transparent, and during test, the plate-shaped solar panel can move to the position under the working plate and collects light emitted by the LED flip-chip. The LED flip-chip testing method is characterized in that the working plate is transparent, and the plate-shaped solar panel is used for collecting light emitted by the chip under the working plate. The solar panel is small in size and adopts a plane structure, so that mounting and moving operation is convenient, and during test, positioning is more accurate, and light leak is not easy.

Description

technical field [0001] The invention relates to a chip testing machine and a testing method, in particular to a flip-chip LED chip testing machine and testing method. Background technique [0002] Flip-chip LED chips are essentially based on the traditional technology. The light-emitting area and the electrode area of ​​the LED chip are not designed on the same plane. At this time, the electrode area is placed toward the bottom of the lamp cup, which can save the need for welding wires. a process. Compared with regular LED chips, flip-chip LED chips have the advantages of low voltage, high brightness, high reliability, high saturation current density, and better heat dissipation, and can integrate protection circuits on flip-chip substrates. , which is obviously helpful to chip reliability and performance. In addition, compared with the front-mounted and vertical structures, the flip-chip method is easier to realize ultra-high-power chip-level modules and multi-function in...

Claims

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Application Information

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IPC IPC(8): G01R31/26
Inventor 王维昀周爱新李大喜毛明华李永德马涤非吴煊梁
Owner 东莞市福地电子材料有限公司
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