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Method for rapidly extracting transverse dimension and position of beam

A technology of horizontal dimension and extraction method, which is applied in the direction of measuring devices, optical devices, instruments, etc., and can solve problems such as high cost, large amount of data, and complicated operation

Inactive Publication Date: 2013-08-21
UNIV OF SCI & TECH OF CHINA
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  • Abstract
  • Description
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Problems solved by technology

[0004] The purpose of the present invention is: to overcome the deficiencies of the prior art, provide a kind of method of acquiring circle-by-circle and bunch-by-bunch lateral size and position information, so as to improve the large amount of data, poor real-time performance and high cost caused by the Gaussian fitting method and complicated operation, and provide guidance for the follow-up accelerator application research

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  • Method for rapidly extracting transverse dimension and position of beam
  • Method for rapidly extracting transverse dimension and position of beam
  • Method for rapidly extracting transverse dimension and position of beam

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Embodiment Construction

[0049] The present invention will be described in further detail below in conjunction with the accompanying drawings and embodiments.

[0050] Such as figure 1 Shown, the present invention is concretely realized as follows:

[0051] 1. Establish the mathematical model of the light intensity distribution of the synchronous light and calculate the photocurrent according to the parameters.

[0052] Since the horizontal light intensity distribution of synchronous light is Gaussian distribution, considering that the multi-anode photomultiplier tube is a one-dimensional linear array, record the one-dimensional light intensity distribution as:

[0053] Φ ( x ) = Φ 0 e - ( x - δ ) ...

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Abstract

Provided is a method for rapidly extracting the transverse dimension and the position of a beam based on a multi-anode photo-multiplier tube. The method comprises the following steps: building a mathematical model of light intensity distribution on four continuous channels of the multi-anode photo-multiplier tube, carrying out integration and obtaining a light current, carrying out logarithm processing and obtaining a dimension signal and a position signal of the beam, fitting and obtaining an ideal dimension signal and an ideal position signal when response characteristics of the four continuous channels of the multi-anode photo-multiplier tube are consistent, fitting and obtaining a dimension signal and a position signal when channel difference exists based on a linear error model, deducing a correction computational formula of the transverse section dimension and the position of the beam when channel inconformity exists, and obtaining an error of correction signals and the ideal signals according to calibration parameters. Compared with a Gaussian fitting method for extracting the transverse dimension and the position of the beam, the logarithm processing method has the advantages of being higher in speed, smaller in data storage content, lower in complexity and easier to achieve and the like under the premise of ensuring precision.

Description

technical field [0001] The present invention relates to logarithmic processing techniques, and in particular to methods for extracting turn-by-turn and bunch-by-bunch transverse section dimensions and central orbits in storage rings. Background technique [0002] In the storage ring, in order to study the beam dynamics, beam nonlinearity, beam instability, and beam injection process, it is necessary to measure the transverse dimension of each circle or cluster. Foreign accelerators generally use multi-anode photomultiplier tubes and multi-channel high-speed data acquisition cards to extract data, and then use Gaussian fitting to extract the lateral size and position of the beam. [0003] When the high-energy electron beams pass through the diode iron for bending motion, synchrotron radiation light is generated in the direction of instantaneous movement, and the beam envelope reflects the characteristics of the electron beams at the light-emitting point. The generated synchr...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/00
Inventor 程超才孙葆根杨永良卢平
Owner UNIV OF SCI & TECH OF CHINA