Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Testing shell suitable for on-chip network embedded type IP core

A network-on-chip and embedded technology, applied in the detection of faulty computer hardware, etc., can solve the problems of poor adaptability of other test modes, inapplicability of multicast test mode, no reference to NoC test optimization effect, etc., to reduce transmission The effect of data volume

Inactive Publication Date: 2013-09-04
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
View PDF9 Cites 10 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The existing test interface design scheme is only suitable for the test of the embedded IP core in the common unicast mode. The disadvantage is that it does not mention the test optimization effect of the specific NoC under the specific structure, and it is less adaptable to other test modes. Poor, i.e. not suitable for multicast test mode

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Testing shell suitable for on-chip network embedded type IP core
  • Testing shell suitable for on-chip network embedded type IP core
  • Testing shell suitable for on-chip network embedded type IP core

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0023] The technical solution of the invention will be described in detail below in conjunction with the accompanying drawings.

[0024] Taking the S444 circuit in the ISCAS89 reference timing circuit as an example, the circuit realization of each component of the test case, the interface circuit of the test case and the data transmission routes of various test modes are described in detail.

[0025] The S444 core structure after adding the test shell is as follows figure 2 As shown, including parallel input port Pi[2:0], parallel bypass register, parallel output port Po[2:0], serial input port Si, serial bypass register, serial output port So, test control register , a first multiplexer m1 , a serial test response comparator, a parallel test response comparator, a correct test response signal parallel input port Com_pi[2:0], a correct test response signal serial input port Com_si. The input terminal of the parallel bypass register is connected to the parallel input port Pi[...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a testing shell suitable for an on-chip network embedded type IP core and belongs to the technical field of embedded type IP core testing. The testing shell suitable for the on-chip network embedded type IP core comprises a parallel input port, a parallel bypass temporary storage, a parallel output port, a serial input port, a serial bypass temporary storage, a serial output port, a testing control temporary storage, a first multiplexer, a parallel testing response comparator, a serial testing response comparator, a correct testing response signal parallel input port and a correct testing response signal serial input port. Testing stimulus and correct testing response are simultaneously sent in an IP core to be tested, only one data sub-package is needed to complete testing, and the transmitting data size can be effectively reduced for a multicast transmission mode.

Description

technical field [0001] The invention discloses a test shell suitable for an embedded IP core of an on-chip network, and belongs to the technical field of embedded IP core testing. Background technique [0002] The design of NoC (Network-on-Chip, network on chip) adopts the same design pattern based on IP core multiplexing as SoC (System on Chip, system on chip). Improve the design efficiency of NoC and shorten the development cycle. The multiplexing of IP core includes not only the multiplexing of circuit logic, but also the testing multiplexing of IP core. When a large number of IP cores are embedded in the NoC, the external pins of the chip can only access the ports of the IP cores through the data packet forwarding mode. The original test method of a single IP core is no longer applicable to the integrated IP core, thus The embedded IP core test port loses its original observability and controllability. In addition, the multiplexed IP cores come from different companie...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/22
Inventor 张颖吴宁叶云飞兰利东周芳葛芬
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products