Image force microscopy of molecular resonance

An atomic force microscope, molecular technology, applied in scanning probe microscopy, manipulation of single atoms, instruments, etc., can solve the problem of spectral identification without the use of detection materials
CN103299197AActive Publication Date: 2013-09-11RGT UNIV OF CALIFORNIA
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
RGT UNIV OF CALIFORNIA
Publication Date
2013-09-11

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Abstract

A new method in microscopy is provided which extends the domain of AFM's to nanoscale spectroscopy. Molecular resonance of nanometer features can be detected and imaged purely by mechanical detection of the force gradient between the interaction of the optically driven molecular dipole / multipole and its mirror image in a Platinum coated scanning probe tip. The method is extendable to obtain nanoscale spectroscopic information ranging from infrared to UV and RF.
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Description

technical field

[0001] Cross-references to related patents

[0002] This patent claims the benefit of US Patent Application Serial No. 61 / 401,495 filed August 13, 2010, the entire contents of which are incorporated herein by reference. field of invention

[0003] The present invention relates to microscopy, in particular, the present invention relates to the utilization of atomic force microscopy for nanoscale spectroscopic analysis.

[0004] government support

[0005] This invention was made with government support under Grant Nos. HG004431 and HG004549 awarded by the National Institutes of Health, and the United States Government has certain rights in this invention. Background technique

[0006] Atomic Force Microscopy (AFM) has been successfully applied to surfaces with chemical 1 magnetic 2,3 And electrostatic (electrostatic) 4,5 Nanoscale imaging of properties. These microscopes rely on the probe tip (commonly silicon) to change appropriately to detect a speci...

Claims

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