Method for detecting parameters of lenticular grating for three-dimensional printing
A lenticular lens grating and parameter detection technology, applied in the field of optical detection, can solve the problems of unguaranteed detection accuracy, large influence, troublesome testing, etc., achieve good market prospects, avoid errors, and achieve accurate and reliable data values
Inactive Publication Date: 2015-03-18
UNIV OF SHANGHAI FOR SCI & TECH +1
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Problems solved by technology
[0009] From the above method, we can see the defects of the traditional three-dimensional lenticular proofreading technology: (1) the test is cumbersome, and many test strips need to be printed or many test images need to be produced; (3) The detection accuracy cannot be guaranteed
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Embodiment 1
[0050] see figure 2 , image 3 , the invention discloses a method for detecting the number of lines of a lenticular grating for three-dimensional printing, which specifically includes the following steps:
[0051] [Step S1] Place the measured lenticular lens grating 1 on the marble work surface 5, align the left end of the lenticular lens grating 1 with the vertical reference plane 51 of the marble work surface 5, and place the measured lenticular lens grating 1 with the grating facing upward, The plane is placed on the horizontal reference plane 52 of the marble worktop 5.
[0052] [Step S2] Start the test system, and initialize all sensors; Picture 1-1 , Figure 1-2 As shown, the coordinate system is established, and the X-axis and Y-axis are set on the marble worktable (or the plane of the measured cylinder grating), or parallel to the marble worktable (or the plane of the measured cylinder grating). The motor drives the electronic digital display dial indicator mounti...
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The invention discloses a method for detecting parameters of a lenticular grating for three-dimensional printing. The method comprises the steps of fixedly placing the lenticular grating to be detected on a workbench; adjusting the position of an electronic digital micrometer on an electronic digital micrometer mounting base; moving the electronic digital micrometer along a first direction and acquiring data of the electronic digital micrometer mounting base in the first / second direction by using a data acquisition module, wherein the first direction is perpendicular to the second direction; saving the measured data of the electronic digital micrometer mounting base in the first direction and data of the electronic digital micrometer in the second direction; and analyzing test data, fitting the curved surface of the lenticular grating to be detected and calculating the parameters of the lenticular grating to be detected. By means of the method, the parameters of the lenticular grating to be detected can be detected in real time through a computer, printing of test strips or production of test images are not needed, and errors caused by artificial observation are avoided. The method has the advantages of high efficiency, high stability and high reliability.
Description
technical field [0001] The invention belongs to the technical field of optical detection, and relates to a method for detecting parameters of a lenticular grating, in particular to a method for detecting parameters of a lenticular grating for three-dimensional printing. Background technique [0002] In the traditional printing industry, the status of ordinary flat prints in the field of information dissemination is gradually declining. Three-dimensional printing, which makes static two-dimensional images come alive, is impacting people's visual experience and becoming a new economic growth point in the printing industry. Three-dimensional printing is a printing method that integrates grating plate refraction image separation technology and printing technology, prints multiple images that have undergone special encoding processing on the same plane, and uses gratings to make the plane image present a three-dimensional stereoscopic visual effect or animation variation effect. ...
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IPC IPC(8): G01M11/02G01B7/28
Inventor 李春梅曾忠郑亮徐东方恩印周颖梅程鹏飞金张英
Owner UNIV OF SHANGHAI FOR SCI & TECH