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Continuous spectrum scattering type particle measurement method

A measurement method and scattering technology, applied in measurement devices, particle suspension analysis, particle and sedimentation analysis, etc., can solve problems such as affecting measurement results, few data sampling points, weak signals, etc., to improve signal strength and wavelength sampling points. More, the effect of improving reliability

Inactive Publication Date: 2013-09-18
HEBEI UNIV OF TECH
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Problems solved by technology

[0006] The purpose of the present invention is to solve the problem that in the existing light scattering method for measuring particle size and concentration, there are few data sampling points and weak signals that affect the measurement results, and to provide a particle measurement method based on continuous spectrum scattering

Method used

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Embodiment 1

[0019] figure 1 Shown is a schematic diagram of the continuous spectrum scattering particle measurement method provided by the present invention. The laser particle size analyzer involved in the method comprises: a continuous spectrum light source (1), a collimating lens (2), a focusing mirror (4) and a spectrometer (6).

[0020] The concrete steps of this method are:

[0021] The light of continuous wavelength emitted by the light source (1) becomes parallel light after being collimated by the collimator lens (2), and irradiates in the sample field of the particle sample (3) to be tested. After the particles are scattered, they are converged to one point by the focusing mirror (4);

[0022] Place the receiving port (or optical fiber (5) port) of the spectrometer (6) (generally using the optical fiber (5) to guide the light) at the converging point of the focusing mirror (4), after the particles scatter light of different wavelengths, the spectral distribution is different ...

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Abstract

The invention discloses a continuous spectrum scattering type particle measurement method, and solves the problems that signals received at a large scattering angle are weak and sampling points are few by adopting a light source with a single wavelength or several wavelengths during the measurement on the granularity and the concentration of particles by a light scattering method. According to the method, light with continuous wavelengths is irradiated to sample particles to produce scattering signals; scattered light within a certain scattering angle range is gathered together and then is introduced into a spectrometer for analysis, so that scattered signal distributions with different wavelengths can be obtained; the scattered signals are distributed concerning the granularity of the particle; the granularity and the concentration distribution of the particles can be obtained through a data algorithm. According to the method, the light signals within a large scattering angle range are gathered together to be received, so that the signal intensity is improved; the signals are analyzed by a continuous spectral light source and the spectrometer, so that the number of signal sampling points is increased, and the measurement resolution and the signal-to-noise ratio are improved.

Description

technical field [0001] The invention relates to a continuous spectrum scattering particle measurement method. Suitable for particle size and concentration measurement. Background technique [0002] With the acceleration of industrial processes, and in order to meet the requirements of environmental protection work, it is necessary to measure the particle samples in the industrial process and the particles in the environment. For example, particulate matter smaller than 2.5 microns is called PM2.5. They are more harmful to the human body and need to be measured intensively. Because the light scattering measurement method directly obtains the scattering signal of particles, its measurement period is short and its real-time performance is good, so it has been widely studied and applied. The incident light source generally adopted by the light scattering method is a light source of a single wavelength or several wavelengths, and there are some difficulties in the measurement ...

Claims

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Application Information

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IPC IPC(8): G01N15/02G01N15/06
Inventor 魏永杰李春雨刘翠翠
Owner HEBEI UNIV OF TECH
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