IR cut filter and lens module

A technology of infrared cut-off and lens module, applied in the direction of filters, optics, optical components, etc., can solve the problem of deteriorating the imaging quality of the imaging system, and achieve the effect of preventing the imaging quality and improving the reflectivity.

Inactive Publication Date: 2016-12-21
HONG FU JIN PRECISION IND (SHENZHEN) CO LTD +1
View PDF5 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, sapphire has a high transmittance to infrared light, and if the infrared light cannot be filtered, the imaging quality of the imaging system will be degraded

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • IR cut filter and lens module
  • IR cut filter and lens module
  • IR cut filter and lens module

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] Such as figure 1 As shown, an infrared cut filter 100 provided by an embodiment of the present invention includes a substrate 10 and an infrared cut layer 20 plated on any surface of the substrate 10 . The infrared cut-off filter 100 is used to filter out the infrared light in the light.

[0014] The substrate 10 is flat and made of sapphire material. The sapphire belongs to the corundum minerals, has a trigonal crystal system, and has a hexagonal structure. The main chemical composition of the sapphire is aluminum oxide (Al 2 O3), its refractive index is 1.76-1.78. The transmittance of the sapphire to infrared light with a wavelength of 825-1300nm is greater than 85%. The substrate 10 includes a first surface 11 and a second surface 12 opposite to the first surface 11 .

[0015] The infrared cut-off layer 20 is deposited on any surface of the substrate 10 by sputtering or vapor deposition, and is used to filter out the infrared light in the light. The infrared cu...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

PropertyMeasurementUnit
refractive indexaaaaaaaaaa
refractive indexaaaaaaaaaa
refractive indexaaaaaaaaaa
Login to view more

Abstract

The invention provides an infrared cut-off filter, which comprises a substrate and an infrared cut-off layer plated on the substrate. The substrate is made of sapphire. The infrared cut-off layer is formed by alternately stacking a plurality of high-refractive-index layers and low-refractive-index layers, which is used to increase the reflectivity of infrared rays in light to filter out infrared rays. The infrared cut-off filter provided by the present invention effectively improves the reflectivity of the sapphire substrate to infrared light by coating a layer of infrared cut-off layer on the substrate made of sapphire to filter out the infrared light, so as not to affect the use of the infrared light The image quality of the lens module of the cut-off filter is affected. The invention also provides a lens module using the infrared cut filter.

Description

technical field [0001] The invention relates to an optical element, in particular to an infrared cut-off filter and a lens module using the infrared cut-off filter. Background technique [0002] Sapphire is widely used in imaging systems due to its high hardness and high wear resistance. However, sapphire has high transmittance to infrared light, and if the infrared light cannot be filtered, the imaging quality of the imaging system will be degraded. Contents of the invention [0003] In view of this, it is necessary to provide an infrared cut-off filter using sapphire as a substrate and a lens module using the infrared cut-off filter that can improve the imaging quality. [0004] An infrared cut-off filter includes a base plate and an infrared cut-off layer plated on the base plate. The substrate is made of sapphire. The infrared cut-off layer is formed by alternately stacking multiple high-refractive-index layers and low-refractive-index layers, which is used to incre...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Patents(China)
IPC IPC(8): G02B5/20G02B7/02B32B9/04B32B33/00
Inventor 简士哲林君鸿魏朝沧
Owner HONG FU JIN PRECISION IND (SHENZHEN) CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products