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Reliability allocation system and allocation method based on fault tree and analytic hierarchy process

An AHP, reliability technology, applied in special data processing applications, instruments, electrical digital data processing, etc., can solve problems such as too simple allocation, too strong subjectivity, and unreasonable allocation.

Active Publication Date: 2013-12-11
HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0010] For large and complex systems, these unconstrained reliability allocation methods have their own shortcomings and limitations, such as incomplete consideration of factors, too strong or insufficient subjectivity, and unreasonable allocation caused by too simple allocation.

Method used

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  • Reliability allocation system and allocation method based on fault tree and analytic hierarchy process
  • Reliability allocation system and allocation method based on fault tree and analytic hierarchy process
  • Reliability allocation system and allocation method based on fault tree and analytic hierarchy process

Examples

Experimental program
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Effect test

Embodiment

[0229] In the following, the failure of the passive waste heat removal system under the small breach loss-of-flow accident of the ADS subcritical reactor is taken as an application example to carry out the reliability distribution. established as Image 6 The fault tree shown is analyzed, and the external parameters of the system are input to obtain the minimum cut set list and basic event list:

[0230] List of basic events

[0231]

[0232] Minimal cut set list

[0233]

[0234] Calculate the current reliability of the system R s =0.99998905, according to the current reliability of the system R s , to obtain the system target reliability R S 'External system parameter input R S '=0.99999900

[0235] Carry out the first step of reliability allocation, select 4 minimum cut sets as the first step of reliability allocation objects, consider all the factors of the criterion layer, assign the system target reliability as the target reliability of the selected minimum c...

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Abstract

Provided are a reliability allocation system and an allocation method based on a fault tree method and an analytic hierarchy process. The fault tree method is combined with the analytic hierarchy process, the fault tree method serves as the body, and thus reliability is allocated according to the height of the total system. Reliability allocation is divided into two steps by means of the analytic hierarchy process, namely when allocation is carried out in the first step, critical components with reliability needing to be increased are selected from the system, and target reliability of the system is allocated to be the target reliability of a minimal cutest; when allocation is carried out in the second step, subjective judgment is combined with objective calculation, the target reliability of the minimal cutest is allocated to be the target reliability of a basic event, and the target reliability of the system is allocated to the target reliability of an element or a subsystem.

Description

technical field [0001] The invention relates to a reliability distribution system based on fault tree and hierarchical analysis method, which belongs to the field of reliability distribution of complex systems. Background technique [0002] Reliability design is an indispensable step to obtain high reliability of products. Reliability design consists of two important links: reliability prediction and reliability allocation. Reliability allocation is based on the reliability indicators specified in the task design book, and is assigned to the subsystems, subsystems or components that make up the system from top to bottom according to certain rules. [0003] The reliability distribution of the system is not just a simple quantity distribution, but many influencing factors should be considered in the redistribution process. The reliability of the system is a quantity that changes with the type of functions to be completed by the functional components and the complexity of the...

Claims

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Application Information

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IPC IPC(8): G06F19/00
Inventor 李博远胡戎翔汪进王芳贾伟吴宜灿
Owner HEFEI INSTITUTES OF PHYSICAL SCIENCE - CHINESE ACAD OF SCI
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