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An ultra-precise measurement method based on multi-sensor scanning

An ultra-precision measurement, multi-sensor technology, applied in the field of measurement applications, can solve problems such as affecting measurement results and low signal-to-noise ratio, and achieve the effects of improving measurement speed, reducing measurement time, and reducing the amount of sampled data

Inactive Publication Date: 2017-04-26
NAT UNIV OF DEFENSE TECH
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  • Abstract
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  • Claims
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Problems solved by technology

[0006] When using a measuring instrument with a large number of sensors and a small interval, such as a compact interferometer (TRIOPTICSμphase1000, etc.) or a 2D laser profile scanner, each pixel can be used as a displacement sensor, which is equivalent to Multi-displacement sensors are used for scanning measurement. At this time, the interval between each pixel point is quite small (to the micron level), that is, the sensor interval is quite small. If the scanning step is equal to the sensor interval at this time (at this time, it can be reconstructed by the successive two-point method) There are quite a lot of points to be collected (there are quite a few data files, and one position corresponds to one data file), and due to the small interval and low signal-to-noise ratio, it will affect the final measurement result

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Embodiment Construction

[0039] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0040] The successive two-point method can accurately reconstruct the straightness profile of the measured surface, but cannot determine its inclination and translation. The interferometer has a lot of pixels (that is, the distance sensor), and the spacing is small. Select a combination of sensors with a certain interval to implement successive two-point reconstruction. At this time, the reconstruction interval is equal to the selected sensor spacing (in order to improve the signal-to-noise Ratio / sensitivity, generally much greater than two effective pixel pitches), for the same section, every two sensors can reconstruct a straightness profile, but the relative positional relationship between these straightness profiles (relative inclination and translation amount) but need to try to determine.

[0041] In order to determine the rela...

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Abstract

The invention relates to a super-precise measuring method based on scanning of multiple sensors. The super-precise measuring method includes the following steps that two sets of sensors with difference intervals are constructed, a successive two-point method is adopted by the two sets of sensors to reconstruct two sets of linearity contours, and the interval between the two sets of linearity contours is determined, so that same sampling points can be found in the front set of curves and the rear set of curves; if a certain curve in one set of curves and a certain curve in the other set of curves at least share two identical sampling points, relative displacement amount and inclination amount between the two curves are calculated according to the two identical sampling points, so that the position relation between the two curves is determined; as the mutual position relations between the first set of curves and a certain curve in the second set of curves in the first set of curves are respectively determined, the mutual position relation of the first set of curves is determined and therefore, linearity contours of a detected surface are accurately reconstructed on all the sampling points. The super-precise measuring method based on scanning of multiple sensors is high in measuring precision, high in measuring speed, and capable of eliminating errors of a sensor system and linearity errors of a scanning platform.

Description

technical field [0001] The present invention mainly relates to the field of measurement application technology, in particular to an ultra-precision measurement method based on multi-sensor scanning, which is mainly applicable to the straightness, flatness, ultra-precision optical surface, and even optical free-form surface of precision and ultra-precision workpiece surfaces. shape measurement. Background technique [0002] The error of optical surface shape will cause the beam to shift, which will make the imaging blurred, the focal point will expand, and the accuracy of the wavefront will be reduced, which will affect the performance of the optical system. In order to process the optical surface shape with higher precision, accurate measurement is very important for the development of optical systems, especially for many high-tech fields that require nanometer precision, ultra-precision measurement of optical surfaces is very important. For example: synchrotron (accelerate...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/27
Inventor 尹自强李圣怡戴一帆田富竟李宁刘晓东
Owner NAT UNIV OF DEFENSE TECH
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