Morphology compensation type three-optical-axis linear displacement laser interferometer calibration method and device

A laser interferometer and laser interferometry technology, applied in the direction of optical devices, measuring devices, instruments, etc., can solve the inconsistency of influence, large Abbe error, and the inability to determine whether the interference mirror group and the measuring mirror belong to the standard laser interferometer components or It belongs to the problem of being calibrated to achieve the effect of ensuring accuracy and small Abbe error

Active Publication Date: 2014-01-22
HARBIN INST OF TECH
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Problems solved by technology

Since the two sets of laser interferometers are placed in parallel, the two paths of light are similarly affected by the environment, and the refractive index of air has little influence on the two paths of light. Big error
[0004] figure 2 It is a schematic diagram of the face-to-face laser interferometer calibration device. The standard measuring mirror and the calibrated measuring mirror are installed on the moving platform face to face. The advantage is that the measuring beam axes of the two sets of laser interferometers can be adjusted to almost the same measuring axis. The Abbe error is very small. The disadvantage is that the near end of one interferometer is the far end of the other.
[0005] In 2011, the National Institute of Metrology established the first 80-meter long-length laser interferometer measurement device in China (Leng Yuguo, Tao Lei, Xu Jian. Analysis of the accuracy and influencing factors of the dual-frequency laser interferometer system based on the 80-meter measurement device. Metrology and Testing Technology, 2011, 38(9): 47-49), the standard device used is to place three Agilent5530 long-distance dual-frequency laser interferometers in parallel to form a three-way

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  • Morphology compensation type three-optical-axis linear displacement laser interferometer calibration method and device
  • Morphology compensation type three-optical-axis linear displacement laser interferometer calibration method and device
  • Morphology compensation type three-optical-axis linear displacement laser interferometer calibration method and device

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[0027] The specific embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings.

[0028] A shape-compensated three-optical axis displacement laser interferometer calibration device, comprising a standard laser interferometer laser 1 and three receivers 7 arranged at positions that can respectively receive interference signals corresponding to three parallel standard measuring beams 3, 4, and 5 , 8, 9, wires connect the three receivers 7, 8, and 9 to the standard laser interferometer signal processing system 10; the standard laser interferometer laser 1 output optical path is equipped with a middle through hole 14 to allow the laser to be calibrated The three-axis hollow standard laser interferometer group 2 through which the interferometer measurement beam 13 passes; the three-axis hollow standard laser interferometer group 2 is equipped with a guide rail 19 on one side, and the moving table 18 is installed on the g...

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Abstract

The invention discloses a morphology compensation type three-optical-axis linear displacement laser interferometer calibration method and device, and belongs to the technical field of laser measurement. A calibrated laser interferometer measurement light beam is caused to pass through a middle through hole of a three-axis hollow laser interferoscope group and is arranged on the center position of three parallel standard measurement light beams distributed in a regular triangular prism side edge mode in parallel; in a plane vertical to the three standard measurement light beams, the difference of the environment interference degree between the three standard measurement light beams and the calibrated laser interferometer measurement light beam is small in an equilateral triangle area formed by the projection points of the three standard measurement light beams in the plane; the air refractive index average value of the three standard measurement light beams is approximate to the air refractive index value of the calibrated laser interferometer measurement light beam; a measurement error caused by the surface morphology of a target reflecting mirror reflecting surface is compensated into a linear displacement measurement result to guarantee the accuracy of a linear displacement measurement value.

Description

technical field [0001] The invention belongs to the technical field of laser measurement, and mainly relates to a laser interferometer calibration method and device. Background technique [0002] Laser interferometry linear displacement technology is a standard measurement technology with high precision. It is widely used in precision and ultra-precision machining, microelectronics equipment, nanotechnology industrial equipment and national defense equipment. In order to ensure the accuracy of laser interferometer measurement of linear displacement , requires a scientific and effective linear displacement laser interferometer calibration method and device. The general idea of ​​calibrating a linear displacement laser interferometer is to use a linear displacement laser interferometer with a higher level of precision for calibration. When the accuracy of the two is similar, it is called comparison. In the actual calibration work, most of the linear displacement laser interfe...

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Application Information

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IPC IPC(8): G01B11/02
Inventor 谭久彬胡鹏程毛帅
Owner HARBIN INST OF TECH
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