Method for measuring IEC (International Electrical Commission) standard voltage flicker

A standard voltage and voltage flicker technology, applied in the measurement of rate of change and other directions, can solve the problems of occupying a large RAM storage space, lost waves in the measurement system, and inaccurate measurement accuracy.

Active Publication Date: 2014-01-29
ELEFIRST SCI & TECH
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  • Abstract
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  • Claims
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Problems solved by technology

[0004] Most of the existing voltage flicker measurement methods use fast Fourier transform (FFT) for calculation (such as the Chinese invention patent application with application number 201110124225.4 and publication number CN102288807A), but the problem with this method is that the calculation of fast Four

Method used

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  • Method for measuring IEC (International Electrical Commission) standard voltage flicker
  • Method for measuring IEC (International Electrical Commission) standard voltage flicker
  • Method for measuring IEC (International Electrical Commission) standard voltage flicker

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Embodiment

[0034] The method for measuring IEC standard voltage flicker in this embodiment is applied to a measurement system composed of a controller and a three-phase electric energy metering chip. And register the voltage peak value, the voltage peak value is the voltage wave peak value or the voltage wave valley value. The three-phase electric energy metering chip can be purchased, such as the ATT7022E of Juquan Optoelectronics Technology Co., Ltd.; the controller can use MCU; the controller and the three-phase electric energy metering chip can be connected by SPI bus communication.

[0035] Such as figure 1 Shown, the present embodiment method comprises the following steps:

[0036] The first step is to start the measurement; the measurement system is initialized and all voltage weighted data U is cleared j , and set j=1 to clear all short-term voltage flicker values ​​P st [n], and let n=1;

[0037] The second step, the controller collects the peak voltage:

[0038] S1. Initia...

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Abstract

The invention relates to a method for measuring IEC (International Electrical Commission) standard voltage flicker. The method includes initializing a measuring system, collecting voltage peak, preprocessing data, processing data based on a table look-up algorithm, processing data based on a frequency compensation algorithm, calculating short-time voltage flicker value, and calculating long-time voltage flicker value. With the simplified calculating process, RAM storage space occupancy rate is reduced, sampling continuity is guaranteed, and measurement accuracy is ensured.

Description

technical field [0001] The invention relates to a method for measuring IEC standard voltage flicker, which is applied to the detection and analysis of the power quality of the power supply and distribution system in the power system. Background technique [0002] According to the applicant's understanding, voltage flicker refers to the visual response of the human eye that the illuminance of the incandescent lamp is unstable due to voltage fluctuation. The reason why incandescent lamps are chosen as the reference standard is because incandescent lamps occupy a considerable proportion in office, commercial and civil buildings, and the optical power of incandescent lamps is proportional to the square of the grid voltage, which is most affected by voltage fluctuations. In power system, voltage flicker is one of the important parameters in power quality assessment standards. [0003] Since the national government advocates sustainable development and requires vigorous developme...

Claims

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Application Information

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IPC IPC(8): G01R19/12
Inventor 周宇王辉郑智何金海
Owner ELEFIRST SCI & TECH
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