Device and method for detecting uniformity of infrared optimal material

A technology of infrared optical materials and detection devices, which is applied in the direction of optical testing of flaws/defects, analysis of materials, instruments, etc., to achieve better material uniformity and accurate evaluation of material uniformity

Inactive Publication Date: 2014-02-05
WUHAN UNIV OF TECH
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

As the magnification of the microscope increases, the depth of field will decrea

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  • Device and method for detecting uniformity of infrared optimal material
  • Device and method for detecting uniformity of infrared optimal material

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Embodiment Construction

[0033] The double-circumferential spring synchronizer of the embodiment of the present invention will be described in detail below with reference to the accompanying drawings.

[0034]The technical solution adopted by the present invention to solve the above-mentioned technical problems is: a method and device for detecting the uniformity of visible light opaque infrared optical materials, which is characterized in that it includes an infrared light source 1, a stray light shielding tube 2, a collimating component 3, and a beam expanding component 4. Optical filter group 5, infrared beam splitter 9, infrared zoom lens 8, two-dimensional precision mobile stage 6, condenser lens 10, infrared sensor 11, signal acquisition and controller 12, computer 13.

[0035] Infrared light source 1, stray light shielding tube 2, collimating part 3, beam expanding part 4, and filter group 5 are arranged in sequence to form an infrared uniform light source generating device, in which each part s...

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Abstract

The invention discloses a device and method for detecting the uniformity of an infrared optimal material. The device is characterized by adopting a uniform infrared light beam generating device comprising an infrared light source, a stray light shielding pipe, a collimation part and a beam expanding part, wherein incident light is reflected by 90 DEG by an infrared beam splitter, reflected incident light is focused onto a material to be detected through a varifocus lens; a light beam reflected by the material to be measured is transmitted to an infrared sensor through the varifocus lens, the infrared beam splitter and a focusing lens, and the uniformity evaluation of a non-transparent visible light infrared optical material to be detected is realized through processing an infrared signal. Compared with a conventional method and device for evaluating the infrared optical material, the method and the device for evaluating the uniformity of the infrared optical material, disclosed by the invention, are capable of obtaining morphology and position information of a defect within a certain depth of a field of a focusing surface inside the infrared optical material to be detected can be obtained, and obtaining three-dimensional morphology and position information of the defect inside the infrared optical material to be detected, so that a fine evaluation function of the uniformity of the infrared optical material is realized.

Description

technical field [0001] The invention relates to a uniformity detection device and method for visible light opaque infrared optical materials, in particular to a detection method for detecting internal defects of visible light opaque infrared optical materials such as single crystal germanium and chalcogenide glass, and a detection method for material uniformity and device. Background technique [0002] As the range of applications in military and civilian applications becomes wider and wider, the quality requirements of infrared optical materials are also increasing. Internal defects of infrared optical materials (such as streaks, cracks, phase separation, bubbles, etc.) Uniformity and other reasons. [0003] For the detection of the uniformity of visible light transparent optical glass, there are now mature interference or holographic detection methods, and the relevant national standards (GB / T7962.3-2010) have been formed. However, for visible light opaque infrared opti...

Claims

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Application Information

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IPC IPC(8): G01N21/88G01N35/00
Inventor 陶海征乔昂彭飞赵修建
Owner WUHAN UNIV OF TECH
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