An atomic fluorescence sampling needle cleaning device

A cleaning device and atomic fluorescence technology, which is applied in the direction of measuring devices, cleaning hollow objects, cleaning methods and utensils, etc., can solve the problems of current-carrying pollution, affecting the accuracy of experimental results, and low test accuracy, so as to achieve reliable operation and eliminate automatic The effect of sample injection method and simple structure

Active Publication Date: 2016-03-02
BEIJING BOHUI INNOVATION TECH
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  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The sampling needle draws the current directly after drawing the sample, which may cause the pollution of the current, affect the accuracy of the experimental results, and the test accuracy is low

Method used

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  • An atomic fluorescence sampling needle cleaning device

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Embodiment Construction

[0009] The present invention will be further described in detail below with reference to the drawings: this embodiment is implemented on the premise of the technical solution of the present invention, and detailed implementation manners are given, but the protection scope of the present invention is not limited to the following embodiments.

[0010] Such as figure 1 As shown, an atomic fluorescence sampling needle cleaning device involved in this embodiment includes: a current-carrying tank 1, a communication tube 2, a cleaning tank 3, a first overflow tube 4, a second overflow tube 5, and a waste liquid tank 6. One end of the communicating pipe 2 communicates with the lower part of the current-carrying tank 1, the other end of the communicating pipe 2 communicates with the lower part of the cleaning tank 3, and one end of the first overflow pipe 4 communicates with the upper part of the cleaning tank 3. The other end of the first overflow pipe 4 communicates with the upper part ...

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Abstract

The invention provides a washing device for an atomic fluorescence sampling needle, which belongs to the technical field of sampling needle washing devices, and solves the problems that a carrying flow is directly sucked after a sample is sucked by the sampling needle to cause the pollution to the carrying flow, so that the accuracy of an experiment result is influenced and the testing precision is low. According to the washing device for the atomic fluorescence sampling needle, one end of a communication pipe is communicated with the lower part of a carrying flow groove; the other end of the communication pipe is communicated with the lower part of a washing groove; one end of a first overflowing pipe is communicated with the upper part of the washing groove and the other end of the first overflowing pipe is communicated with the upper part of a waste liquid groove; one end of a second overflowing pipe is communicated with the upper end of the carrying flow groove; the other end of the second overflowing pipe is communicated with the upper part of the waste liquid groove. The washing device for the atomic fluorescence sampling needle has the beneficial effects that the technical defects of an automatic sampling manner of a previous atomic fluorescence spectrometer are eliminated; the adopted novel sampling needle washing device is simple in structure and reliable in operation; the accuracy and the testing precision of testing results are improved.

Description

Technical field [0001] The invention relates to an atomic fluorescence sampling needle cleaning device, belonging to the technical field of sampling needle cleaning devices. Background technique [0002] In the prior art, spectroscopic analytical instruments are widely used in the quantitative determination of elements. Atomic fluorescence photometer is a common spectrum analysis instrument. The basic working principle of the atomic fluorescence photometer test process is: each element of the test sample reacts to form the corresponding hydride, which is mixed with hydrogen and carrier gas, enters the atomizer to achieve atomization, and emits a specific wavelength under the irradiation of the excitation light source Atomic fluorescence signal. The detector receives the fluorescence signal and obtains the concentration data of the element according to the characteristic that the intensity of the fluorescence signal is proportional to the element concentration. [0003] At present...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/01B08B9/02
Inventor 宗林茂
Owner BEIJING BOHUI INNOVATION TECH
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