A method for measuring the reflectivity of absorbing materials based on a calibration sphere
A technology of wave absorbing material and testing method, which is applied in the direction of material analysis, analysis material, and measuring device using microwave means, can solve the problem of accurate evaluation of reflectivity characteristics of unfavorable wave absorbing material plates, difficult to adjust in place, and large measurement error. and other problems, to achieve the effect of solving measurement accuracy problems, long calibration period, and easy engineering use.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0035] The present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments, but the present invention is not limited to these embodiments.
[0036] Such as figure 1 As shown, a method for testing the reflectivity of absorbing materials based on a calibration sphere includes the following steps:
[0037] (1), select the main control computer 1, the transmitter 2, the receiver 5, the transmitting antenna 3, the receiving antenna 6, the test cable 8 and the target bracket 7, and select the appropriate diameter size according to the test frequency of the incident microwave and other site factors Two high-gloss metal balls are used as the test target 4; the diameter of the metal balls needs to be greater than 5 times the wavelength of the incident microwave and less than 15 times the wavelength of the incident microwave;
[0038] (2), one of the metal balls in the above steps is treated with a surface-coated absorb...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com