Chip and method for measuring power quality

A power quality and chip technology, which is applied in the direction of measuring electrical variables, measuring electricity, measuring devices, etc., to achieve the effect of improving processing speed, reducing chip cost, and improving reliability

Inactive Publication Date: 2014-02-26
STATE GRID CORP OF CHINA +2
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] However, each manufacturer has repeated labor on the calculation algorithm, and the calculation results are different. Therefore, a complete set of power quality measurement chips and measurement methods are needed to meet the needs of power quality.

Method used

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  • Chip and method for measuring power quality
  • Chip and method for measuring power quality
  • Chip and method for measuring power quality

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Embodiment Construction

[0042] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0043] The chip for measuring power quality provided by the invention.

[0044] The main components of the chip are:

[0045] (1) ARM Cortex-M3MCU core of RISC architecture;

[0046] (2) 7-channel 16-bit precision digital-to-analog conversion (ADC) module: measure 7 channels including the following 7 measurements: 3-phase current, 3-phase voltage and zero-sequence current;

[0047] (3) Coprocessor for calculating power quality parameters: calculating voltage, current and power, electricity, frequency, voltage deviation, three-phase unbalance, harmonics and interharmonics, voltage fluctuations and flicker, voltage sags, swells And voltage interruption, transient parameters, and complete clock-to-clock synchronization and marking;

[0048] (4) AMBA bus control module: communicate with the power quality parameter calcula...

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Abstract

The invention relates to a chip and method for measuring power quality. The chip for measuring the power quality comprises a CortexM3-core CPU, an on-chip SRAM, an on-chip nonvolatile memory, a DDR2 controller, a DMA module, an HPDMA module, an ADC module, a sampling control module, a power quality parameter calculating module, an Ethernet interface, various external interfaces and an AMBA bus control module. The method for measuring the power quality comprises the steps that (1) ADC sampling is controlled and selected by means of the control module, (2) an ADC sampling result is processed by the power quality parameter calculating module, (3) a processed result is measured. According to the chip and method for measuring the power quality, an ADC, an MCU and an electric parameter data processing module are integrated, and the chip can be provided for a power quality monitoring system. The chip and method for measuring the power quality have the advantages that the design is simplified, the frequency of repeated development is reduced, the size of a device is reduced, and the reliability is improved. Due to the fact that the electric parameter data processing module which is used for calculating power quality parameters is adopted, requirements for the performance of the MCU can be greatly lowered, and power consumption is reduced and the processing speed is improved.

Description

technical field [0001] The invention relates to a chip used in a power system, in particular to a chip for measuring power quality and a method thereof. Background technique [0002] With the integration of new energy into the grid and the access of various power electronic equipment, power quality issues are becoming more and more important, and higher requirements are put forward for various levels of power quality monitoring terminals. Generally, power quality monitoring terminals are implemented in the mode of ADC+DSP+MCU, in which ADC is responsible for acquisition, and various manufacturers put forward the requirement of programming DSP to calculate power quality parameters, and the overall control, storage and communication are completed by MCU. [0003] However, each manufacturer has repeated labor on the calculation algorithm, and the calculation results are different. Therefore, a complete set of power quality measurement chips and measurement methods are needed to...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G05B19/042
Inventor 郑哲袁玉湘姜学平胡鹏飞
Owner STATE GRID CORP OF CHINA
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