A fully automatic diode volt-ampere characteristic testing device

Abstract

The invention relates to a full-automatic diode volt-ampere characteristic testing device and belongs to the field of electrical and electronic measuring equipment. The full-automatic diode volt-ampere characteristic testing device comprises an ATmega16 single chip microcomputer which is used as a core control unit for achieving voltage stepping, a relay control switching circuit, a data collecting module and an upper computer are used in cooperation with the ATmega16 single chip microcomputer for achieving automatic data collection, display and storage functions, and a direct-current stabilized-voltage stabilized-current power source supplies power for the whole system. The testing speed is high, testing precision is high, and operation is simple, convenient and quick.

Description

technical field [0001] The invention belongs to the field of electrical and electronic measuring equipment, and relates to a fully automatic diode volt-ampere characteristic testing device. Background technique [0002] In engineering practice, it is often necessary to quickly understand the forward and reverse volt-ampere characteristics of some diodes, so that they can be properly connected to the circuit to perform the corresponding functions. The basic measurement idea is to measure the voltage drop at both ends of the diode connected to the circuit and the current flowing through the diode step by step and draw a curve in the case of using a common signal source to understand its volt-ampere characteristics. . In addition, although some volt-ampere characteristic testing instruments seen so far can complete the basic test of diode volt-ampere characteristics, there are still some problems. Many more complex circuits cannot implement multiple measurements without incre...

AI Technical Summary

Problems solved by technology

In addition, although some volt-ampere characteristic testing instruments seen so far can complete the basic test of diode volt-ampere characteristics, there are still some problems. Many more complex circuits cannot implement multiple measurements without increasing hardware cost and saving time

In addition, the traditional circuit connection method will cause various errors, and the test results will inevitably be unreliable

Although the cost of multiple measurements by using ordinary disconnection and circuit replacement is low, when the controller adds a variety of additional functions to more complex and changeable circuits, its flexibility is not enough to achieve the effect of simple operability, and Instead, it increases the complexity of the hardware

Generally speaking, the convenience of these measurement methods is not high, and the accuracy is poor

Images