Method for conducting device proton signal-event test through accelerator high-energy proton

Abstract

A method for conducting a device proton signal-event test through an accelerator high-energy proton comprises the steps that test samples are processed and the requirements of a signal-event test board and the requirements for selection of high-energy proton energy, the fluence rate and the fluence are satisfied. Single event upset of a large-scale circuit tends to be sensitive along with the increase of the integration degree and the reduction of the feature size. Single event upset can be generated through the method that a nuclear reaction of the proton occurs or the proton is directly ionized. An electronic system fault probably caused by single event upset happens to an on-orbit satellite. The method is used for conducting the device proton single event upset test on the ground. According to the method, the proton single event upset sensitivity of a key device for the satellite can be evaluated, proton single event upset sensitive parameters of the device can be obtained, a basis is provided for anti-radiation reinforcing design of the satellite, and the method for conducting the device proton signal-event test through the accelerator high-energy proton has important significance in the guarantee of the reliability of the new-generation satellite.

Description

technical field [0001] The invention relates to a device proton single particle test method using accelerator high-energy protons, which can be used to guide the evaluation of proton single event flipping sensitivity of large-scale integrated circuits, and provide satellite designers with the ability to select ultra-large-scale integrated circuits and carry out anti-radiation reinforcement design. The reference data also provide reference data for the development of radiation-resistant hardened devices. Background technique [0002] Satellites work in a space radiation environment, and single event effects can cause satellite electronic system failures. With the development of satellite applications, the requirements for satellite reliability continue to increase. However, with the improvement of integration and the reduction of feature size, large-scale circuits tend to be sensitive to single event upsets. Protons can cause single event upsets through nuclear reactions or ...

AI Technical Summary

Problems solved by technology

[0004] At present, a standard method for heavy ion single event testing has been formulated, such as the aerospace industry standard QJ10005, which is suitable for evaluating the single event upset caused by space heavy ions in devices using accelerator heavy ions, but not for the evaluation of single event upset caused by protons

Images