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Method for measuring thickness growth quantified values of aluminum alloy hard anodized films

A hard anodizing and measuring method technology, applied in the direction of mechanical thickness measurement, measuring devices, instruments, etc., can solve the problems of not reaching the expected size, etc., and achieve the effect of continuous film layer, good bonding force and uniform color

Inactive Publication Date: 2014-03-12
GUIZHOU HONGLIN MACHINERY
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Theoretically, the thickness of the hard anodized film of the workpiece grows in the direction of the substrate and the thickness of the film grown outside the substrate is approximately equal, but in actual processing, there is a certain quantitative value between the thickness of the film and the growth of the film. Now, when calculating the size before and after hard anodization, the thickness of the film layer growing into the substrate is equal to the thickness of the film growing outside the substrate, which will often fail to reach the calculated expected size after anodization

Method used

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  • Method for measuring thickness growth quantified values of aluminum alloy hard anodized films
  • Method for measuring thickness growth quantified values of aluminum alloy hard anodized films
  • Method for measuring thickness growth quantified values of aluminum alloy hard anodized films

Examples

Experimental program
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Effect test

Embodiment 1

[0026] A method for measuring the quantitative value of the thickness growth of an aluminum alloy 6061-T6 hard anodized film, comprising the following steps:

[0027] (1) Finishing the outer circle

[0028] The workpiece is CNC processed to a smoothness of 0.4, and the number of workpieces is 16 pieces;

[0029] (2) Detect the size of the outer circle before anodization

[0030] The luminosity of the outer circle measured by the roughness meter is 0.4. After placing it at 21°C for 24 hours, use an outer diameter dial gauge with an accuracy of 0.001 to measure the actual size of the outer circle ф32.986㎜, and record the actual measured values ​​​​of 2 points for each piece. 2 points at different positions on the upper part, and mark the measurement position on the part. The actual measured value results are shown in Table 1:

[0031] Table 1 Measured dimensions of the workpiece before hard anodizing

[0032]

[0033] (3) Hard anodizing:

[0034] Acetone degreasing: the p...

Embodiment 2

[0077] A method for measuring the quantitative value of the thickness growth of an aluminum alloy 6061-T6 hard anodized film, comprising the following steps:

[0078] (1) Finishing the outer circle

[0079] The workpiece is CNC processed to a smoothness of 0.4, and the number of workpieces is 16 pieces;

[0080] (2) Detect the size of the outer circle before anodization

[0081] The luminosity of the outer circle measured by the roughness meter is 0.4. After placing it at 21°C for 24 hours, use an outer diameter dial gauge with an accuracy of 0.001 to measure the actual size of the outer circle ф32.981㎜, and record the actual measured values ​​​​of 2 points for each piece. 2 points at different positions on the upper part, and mark the measurement position on the part. The actual measured value results are shown in Table 6:

[0082] Table 6 Measured values ​​of workpiece dimensions before hard anodizing

[0083]

[0084] (3) Hard anodizing:

[0085] Acetone degreasing: ...

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Abstract

The invention discloses a method for measuring thickness growth quantified values of aluminum alloy hard anodized films. The method includes detecting the sizes of pre-anodization outer circles; performing hard anodization on the outer circles; detecting the sizes of the post-anodization outer circles; computing thicknesses delta <0> and delta of the films according to a formula of delta <0>=delta <1> / 2 and a formula of delta=delta <0>+delta ; detecting the thicknesses delta<2> of the films by the aid of a thickness gauge to obtain the thicknesses delta<2> of the films; or detecting the thicknesses of the films by a metallographic process, in other words, detecting the thicknesses of the films by means of a sectional microscopy, and accurately measuring the thicknesses delta<3> of the films by the aid of a metallographic microscope on sectional surfaces of manufactured ground segments; computing the thickness growth quantified values of the films according to a formula of delta<0> / (delta<2>or delta<3>). The delta<1> represents the thicknesses detected by a dial indicator, the delta<0> represents the thicknesses of parts, which grow towards the outsides of substrates, of the films, and the deltarepresents the thicknesses of parts, which grow towards the insides of the substrates, of the films. The thickness growth quantified values of the films refer to quantified values of the thicknesses of the films and the thicknesses of the parts, which grow towards the outsides of the substrates, of the films. The method has the advantage that the specific quantified values can be acquired, so that consistency of the sizes of post-anodization workpieces and the computed preset sizes of the workpieces can be guaranteed.

Description

technical field [0001] The invention relates to the technical field of metal surface treatment protection engineering, in particular to a method for measuring the quantitative value of the thickness growth of an aluminum alloy hard anodized film layer. [0002] Background technique [0003] At present, when hard anodizing is carried out on aluminum alloy material workpieces, the anode electrochemical method is adopted, which is to immerse the 6061-T6 material workpieces that have been degreased, washed, activated and washed in sulfuric acid + oxalic acid In the solution, the workpiece is used as the anode, and the cathode is made of a lead plate, and anodized at a temperature of -2 to 2°C, so that a thick and wear-resistant hard anodized film is formed on the surface of the workpiece. Theoretically, the thickness of the hard anodized film of the workpiece grows in the direction of the substrate and the thickness of the film grown outside the substrate is approximately equal...

Claims

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Application Information

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IPC IPC(8): G01B5/06G01B11/06
Inventor 夏兆蓉李宏杨亚先
Owner GUIZHOU HONGLIN MACHINERY