Test system of long-term stability of input offset voltage of operational amplifier

A technology of operational amplifier and offset voltage, which is applied in the field of test system for long-term stability of input offset voltage of operational amplifier, can solve problems such as inaccurate results, achieve accurate measurement, reduce errors, and eliminate external influences

Active Publication Date: 2014-03-26
FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] In the above scheme, the test results are not accurate because they are easily affected by external temperature changes.

Method used

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  • Test system of long-term stability of input offset voltage of operational amplifier
  • Test system of long-term stability of input offset voltage of operational amplifier
  • Test system of long-term stability of input offset voltage of operational amplifier

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Embodiment Construction

[0019] In order to make the purpose, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, and do not limit the protection scope of the present invention.

[0020] The test system of the long-term stability of the operational amplifier input offset voltage of the present invention, such as figure 2 As shown, computer, linear DC power supply, voltage collector, temperature monitoring unit, oil tank, metal box and PCB board.

[0021] Among them, there are resistors and capacitors on the PCB, which form a feedback amplifier circuit with the operational amplifier to be tested, such as image 3 As shown, the magnification factor is R2 / R1, which is set to about 1 thousand times, and the original uV level signal is amplified ...

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Abstract

The invention discloses a test system of the long-term stability of the input offset voltage of an operational amplifier. The operational amplifier to be tested is placed in the liquid oil body environment to protect the operational amplifier to be tested from being affected by fluctuations of an air medium; the constant temperature control is performed on an oil body and accordingly the influence of the temperature change on the test is eliminated; meanwhile the operational amplifier to be tested is arranged inside a metal box which is connected with the ground and accordingly the electromagnetic shielding effect on the operational amplifier to be tested is achieved; in addition, the operational amplifier to be tested and a peripheral resistor-capacitor form a feedback amplifier circuit and accordingly the measurement of the output voltage is accurate. Accordingly, the external influence is eliminated, the error is further reduced due to the measurement method, and accordingly the measured long-term stability of the input offset voltage is close to the real situation and the dependence on the staff is reduced due to the fact that the test process is achieved automatically.

Description

technical field [0001] The invention relates to the technical field of operational amplifiers, in particular to a test system for the long-term stability of input offset voltages of operational amplifiers. Background technique [0002] Operational amplifiers are widely used in various electronic devices, mainly for signal acquisition, amplification, calculation and other functions. In order to ensure the quality of such products, product development and production units need to test various parameters. Among them, the input offset voltage long-term stability parameter (Long-term Vos Stability) describes the change degree of the input offset voltage parameter of the operational amplifier product with time, expressed in ΔVos / time, and the unit is uV / Month. This parameter is a measure of this type of product An important indicator of quality stability. [0003] The requirement for long-term stability of input offset voltage is high, and it is difficult to test. Taking a certa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28G01R19/12
Inventor 王晓晗王小强王文双唐锐郑大勇
Owner FIFTH ELECTRONICS RES INST OF MINIST OF IND & INFORMATION TECH
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