The invention relates to an analog-to-
digital conversion method applied to a column-level analog-to-
digital converter. The analog-to-
digital conversion method comprises the following steps: 1)
signal acquisition; 2) sample holding; 3) analog-to-
digital conversion; 4) column-level
parallel processing; 5) digital output; and 6)
data integration. According to the analog-to-digital
conversion method applied to the column-level analog-to-
digital converter, the
dynamic range of a traditional column-level analog-to-
digital converter is enlarged, meanwhile, the range of scene illumination detected by a sensor of the column-level analog-to-digital converter is enlarged, details of an image are increased, and finally the quality of the obtained image is improved; the
input offset voltage influence and the large
noise influence of a
comparator are reduced, and the problems that the
dynamic range of a conventional monoclinic column-level ADC is small, so that the range of scene illumination detected by a sensor using the column-level ADC is narrow, image details are few, the quality of a finally obtained image is poor, the
comparator is a key part in the ADC, and the
image quality is poor are solved. However, the problems of the influence of
input offset voltage of the
comparator and the influence of relatively large
noise exist.