Quick temperature change strengthening test system of OLED module

Abstract

The invention provides a quick temperature change strengthening test system of an OLED module. The quick temperature change strengthening test system comprises an industrial personal computer, a programmable logic controller, a programmable power supply, a spectrograph, an optical probe, a quick temperature changing box and an OLED module bearing device. The OLED module bearing device is arranged in the quick temperature changing box and used for bearing the OLED module to be tested. The industrial personal computer is respectively connected with the programmable power supply, the programmable logic controller, the spectrograph and the quick temperature changing box. The optical probe is arranged above the quick temperature changing box and connected with the spectrograph. The programmable power supply is used for supplying power for the OLED module to be tested. The industrial personal computer is used for controlling the programmable power supply and reading output data of the programmable power supply in real time, controlling on-off of an output of the programmable power supply through the programmable logic controller, controlling operations of the spectrograph and reading detection data of the spectrograph in real time. By adopting the technical scheme, testing on optical parameters of the OLED module can be performed in a large-range quick temperature changing environment can be performed, the accuracy of the testing results is improved, automatic testing process is achieved, and the testing efficiency is improved.

Description

technical field [0001] The invention relates to the technical field of OLED module testing, in particular to a rapid temperature change strengthening testing system for OLED modules. Background technique [0002] For the OLED module (that is, the OLED display module) that leaves the factory, performance tests in various aspects are required. In order to test the working performance of the OLED module in a high and low temperature environment, it is generally necessary to conduct a rapid temperature change strengthening test on the OLED module. [0003] In the existing rapid temperature change intensification test technology, it mainly relies on manual testing. Under the set temperature change environment, the OLED module is placed in the temperature change device for high and low temperature intensification tests, and then the The OLED module is taken out from the temperature change device, and the relevant color parameters of the OLED module are detected by an optical analy...

AI Technical Summary

Problems solved by technology

[0005] Based on this, it is necessary to address the problems of low accuracy of test results and low efficiency of the test process, and provide a schematic structural diagram of a rapid temperature change intensified test system for OLED modules, which improves the efficiency and accuracy of the test

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