Thermal image analysis device and thermal image analysis method

Abstract

The invention discloses a thermal image analysis device and a thermal image analysis method, and relates to the application field of thermal imaging devices and infrared thermal image detection. A thermal imaging device in the prior excessively depends on subjective experiences of a user during photographing to set an analysis area for a thermal image of a photographed subject, thereby being complicated in operation and causing the discreteness of an analysis result to be too high. The thermal image analysis device the thermal image analysis method display a superimposed reference image embodying preset morphological characteristics of the photographed subject in infrared thermal imaging, the reference image is used as a visual reference for photographing the thermal image of the photographed subject, thereby enabling the set analysis area to be convenient for photographing the next subject of the same type, and reducing setting operations of the user. Furthermore, the thermal image of the photographed subject can be analyzed according to an analysis area corresponding to the reference image and the specified analysis mode to obtain an analysis result. Therefore, a common user can also achieve a good photography skill level.

Description

technical field [0001] The thermal image analysis device and thermal image analysis method of the present invention relate to thermal image devices, thermal image processing devices, and the application fields of infrared detection. Background technique [0002] At present, users need to rely on subjective experience to manually set an analysis area for a specific part of the subject's thermal image for analysis to obtain thermal image analysis results. Among them, the analysis area corresponds to a specific part that needs to be analyzed in the infrared thermal image, such as a point, line, surface and other area units or a combination of multiple area units; even if the analysis area is set in advance, it is still very inconvenient to use, because it is very inconvenient for the user As far as the Figure 6 The analysis area F1 shown intuitively understands that the analysis area should be located in the thermal image of the subject. For example, when shooting the next sub...

AI Technical Summary

Problems solved by technology

Among them, the analysis area corresponds to a specific part that needs to be analyzed in the infrared thermal image, such as a point, line, surface and other area units or a combination of multiple area units; even if the analysis area is set in advance, it is still very inconvenient to use, because it is very inconvenient for the user As far as the Image 6 The analysis area F1 shown intuitively understands that the analysis area should be located in the thermal image of the subject. For example, when shooting the next subject of the same type, it is easy because the preset analysis area does not correspond to the thermal image of the subject. Correct location (such as the size of the thermal image of the subject, the position in the infrared thermal image, etc.), resulting in excessive dispersion of the analysis results, making it difficult to carry out effective diagnosis and judgment in the future

[0003] Secondly, the operation of analyzing locale settings is cumbersome and error-prone, such as Image 6 The number, type, position, size and other factors of the area units S01 and S02 in the analysis area F1 shown in the figure change, and the final analysis results may be different. surface, and then placed in the corresponding position of the thermal image of the subject) is quite cumbersome; the setting of the analysis area depends on the user's understanding of the analysis part of the subject. Different subjects have their own analysis parts, and the technical requirements high

Due to the above reasons, it is inconvenient to set complex analysis areas. At present, users use experience to perform simple analysis operations, such as setting the highest temperature to automatically capture. However, this extensive analysis method reduces the reference value of the analysis results during shooting.

[0004] Furthermore, setting the analysis mode corresponding to the analysis area is also a cumbersome operation. Different analysis mode settings will result in different analysis results; the analysis mode setting depends on the user's analysis position, analysis method, The understanding of diagnostic methods is required for setting, which requires extremely high technical requirements for users.

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