Sensitive device immunity estimation method based on multiple sag threshold values and duration time
A sensitive equipment, duration technology, applied in the direction of measuring devices, instruments, measuring electricity, etc., can solve the problems of inaccuracy and over-evaluation
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[0050] In order to make the purpose, technical scheme and advantages of the present invention more clear, the following will combine the voltage sag recording data of a certain power quality monitoring system in my country, and take the site evaluation method for the voltage sag immunity of sensitive equipment proposed by the present invention as an example , to evaluate four typical sensitive devices, namely Logic Programmer (PLC), Adjustable Speed Device (ASD), AC Relay (AC Relay), and Personal Computer (PC). It should be emphasized that the following description is only exemplary and not intended to limit the scope of the invention and its application.
[0051] Step 1: Calculate the root mean square value of the sag recorded wave data to obtain the RMS waveform of the sag.
[0052] Any voltage U during the sag c can be described as t=s -1 (U), two solutions t can be obtained according to the RMS waveform data c1 , t c2 ,. Then T(U c )=|t c1 -t c2 |Where 0.1≤U c ≤0...
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