Switch matrix, automatic test system and detection method for switch matrix therein
An automatic test system and switch matrix technology, applied in the direction of electronic circuit testing, circuit breaker testing, measuring electricity, etc., can solve the problems of poor electrical performance, untimely information feedback, and unrecorded functions of sub-boards, etc. Speed, the effect of ensuring correctness
Active Publication Date: 2017-11-03
宋易霄
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Problems solved by technology
[0003] The technical problem to be solved by the present invention is to overcome the slow switching speed and poor electrical performance of the switch matrix in the prior art, and the functions of the sub-boards are not recorded, and the sub-boards cannot feedback the operation information of the relay in time, resulting in untimely information feedback To provide a switch matrix capable of recording the functions of the sub-boards therein and the operation information of the relays fed back by the sub-boards, an automatic test system including the switch matrix, and a detection of the switch matrix in the automatic test system method
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Embodiment Construction
[0028] The preferred embodiments of the present invention are given below in conjunction with the accompanying drawings to describe the technical solution of the present invention in detail.
[0029] like figure 1 As shown, the switch matrix of the present invention includes a slot board 1 into which a plurality of sub-boards 2 are inserted, wherein each sub-board 2 includes an EEPROM chip 21 , a judging module 22 and a transmission module 23 .
[0030] The EEPROM chip 21 can record the functional information of the sub-board 2, specifically including the size of the rated voltage and rated current, whether the contact type is normally open or normally closed, and the number of channels of the sub-board 2, and then it can be judged based on these functional information 2 functions per daughter board.
[0031] And, when there is an external instruction to control the relay in the sub-board 2 to perform operations, the judging module 22 can also judge whether the coil voltage o...
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The invention discloses a switch matrix, an automatic test system and a detection method of the switch matrix. The switch matrix includes a slot board inserted with a plurality of sub-boards, and each sub-board includes a memory chip, a judging module and a Transmission module, the storage chip is used to record the function information of the sub-board, the judging module is used to judge whether the coil voltage of the relay of the sub-board changes, if so, call the transmission module and send the information that the relay has successfully executed the operation , if not, call the transmission module to send out the information that the relay fails to execute the operation. The storage chip of each sub-board in the switch matrix of the present invention can record the functional information of the sub-board, and the sub-board can feed back the operation information of the relay, which meets the requirements of high-speed and timely feedback of modern testing instruments. The automatic test of the present invention The system can also detect the switch matrix to ensure the correctness of the output data of the daughter board.
Description
technical field [0001] The present invention relates to a switch matrix, an automatic test system and a detection method for the switch matrix therein, in particular to a switch matrix capable of recording the functions of the sub-boards therein and the sub-boards capable of feeding back the operation information of the relays, a switch matrix including the An automatic test system for a switch matrix and a detection method for the switch matrix in the automatic test system. Background technique [0002] In the current actual production process, the testing efficiency of the equipment is far lower than the production efficiency of the equipment, coupled with the increase in labor costs, the automatic testing of the equipment is costly and inefficient. By designing the switch matrix, the test time can be greatly reduced, and at the same time, human resources can be saved. The switch matrix can mainly realize the information exchange between the automated test equipment and t...
Claims
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IPC IPC(8): G01R31/00G01R31/327G01R31/28
Inventor 蒋刚
Owner 宋易霄