Automatic test system and switch matrix and detection method thereof in automatic test system

Abstract

The invention discloses an automatic test system and a switch matrix and a detection method thereof in the automatic test system. The switch matrix comprises a slot plate; a plurality of sub-plates are inserted into the slot plate; every sub-plate comprises a memory chip, a judgment module and a transmission module, wherein the memory chip is used for recording the function information of the sub-plate, the judgment module is used for judging whether the coil voltage of a relay of the sub-plate changes or not, the transmission module is called to send out the information which is successfully executed and operated through the relay if yes, and the transmission module is called to send out the information which is unsuccessfully executed and operated through the relay if not. According to the automatic test system and the switch matrix and the detection method thereof in the automatic test system, the memory chip of every sub-plate which is arranged in the switch matrix can be used for recording the function information of the sub-plate, the operation information of the relays can be fed back through the sub-plates, and accordingly the requirements for the high speed and timely feedback of modern test instruments are met and the validity of output data of the sub-plates is ensured due to the fact that the detection can be performed on the switch matrix through the automatic test system.

Description

technical field [0001] The present invention relates to a switch matrix, an automatic test system and a detection method for the switch matrix therein, in particular to a switch matrix capable of recording the functions of the sub-boards therein and the sub-boards capable of feeding back the operation information of the relays, a switch matrix including the An automatic test system for a switch matrix and a detection method for the switch matrix in the automatic test system. Background technique [0002] In the current actual production process, the testing efficiency of the equipment is far lower than the production efficiency of the equipment, coupled with the increase in labor costs, the automatic testing of the equipment is costly and inefficient. By designing the switch matrix, the test time can be greatly reduced, and at the same time, human resources can be saved. The switch matrix can mainly realize the information exchange between the automated test equipment and t...

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Problems solved by technology

[0003] The technical problem to be solved by the present invention is to overcome the slow switching speed and poor electrical performance of the switch matrix in the prior art, and the functions of the sub-boards are not recorded, and the sub-boards cannot feedback the operation information of the relay in time, resulting in untimely information feedback To provide a switch matrix capable of recording the functions of the sub-boards therein and the operation information of the relays fed back by the sub-boards, an automatic test system including the switch matrix, and a detection of the switch matrix in the automatic test system method

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