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Bismuth gallate ferroelectric film material and preparation method thereof

A technology of ferroelectric thin film and thin film materials, applied in chemical instruments and methods, bismuth compounds, inorganic chemistry, etc., can solve the problems of unsuitable devices, integrated circuits, lack of preparation technology, and the inability of bulk materials to be used in the field of microelectronics, etc. Achieve the effect of low cost, good repeatability and stable performance

Inactive Publication Date: 2015-07-08
EAST CHINA NORMAL UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

In recent years, bismuth ferrite (BiFeO 3 ) and bismuth titanate (Bi 4 Ti 3 o 12 ) The design, preparation, physical and chemical properties and application in production and life have been generally recognized and understood. In 2005, Baettig et al. theoretically predicted bismuth gallate (BiGaO 3 ) also have excellent ferroelectric properties, however, bismuth gallate (BiGaO 3 ) material preparation technology is still extremely lacking, only reported that bismuth gallate (BiGaO 3 ), and such high temperature and high pressure production conditions are obviously not suitable for the production of devices and integrated circuits in the microelectronics industry, and its bulk materials cannot be applied to increasingly miniaturized and integrated The field of microelectronics, but the preparation process of bismuth gallate thin film suitable for the field of microelectronics has not yet been reported

Method used

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  • Bismuth gallate ferroelectric film material and preparation method thereof
  • Bismuth gallate ferroelectric film material and preparation method thereof
  • Bismuth gallate ferroelectric film material and preparation method thereof

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Embodiment

[0022] a. Preparation of bismuth gallate solution

[0023] Weigh 2.6948g of bismuth nitrate pentahydrate and 1.8205g of gallium nitrate hexahydrate, pour it into a 100ml flask, add 50ml of acetic acid (analytical grade), and then stir at 60°C to completely dissolve it to obtain a concentration of 0.1M colorless and transparent solution.

[0024] b. Preparation of bismuth gallate thin film materials

[0025] (1) Drop the prepared solution onto a high-speed rotating lanthanum nickelate substrate at a speed of 4000 rpm for 25 seconds to obtain a raw material film;

[0026] (2) Step annealing: heat preservation at 200°C for 200 seconds, then pyrolysis at 400°C for 240 seconds, and finally high temperature annealing at 700°C for 300 seconds;

[0027] (3) Repeat the above process several times to obtain a bismuth gallate thin film material with a thickness of 110 nm.

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Abstract

The invention discloses a bismuth gallate ferroelectric film material and a preparation method thereof. The film material grows on a substrate material, the molecular formula of bismuth gallate is BiGaO3, and a substrate is one of Si, LaNiO3 / Si, Pt / TiO2 / SiO2 / Si and Pt / Ti / SiO2 / Si; the space group of the film material is Pcca, and the lattice constants are as follows: a=5.626 angstrom, b=5.081 angstrom, and c=10.339 angstrom; the preferred orientation of the BiGaO3 film material growing on the selected substrate is (112). The preparation method comprises the following steps: weighing lanthanum nitrate and lanthanum acetate, wherein a molar ratio of bismuth to gallium is 1.1:1, and fully stirring by taking acetic acid at a solvent at the temperature of 60 DEG C to obtain a colorless clear solution; placing the obtained solution on the substrate, spinning to form a film, annealing in a rapid annealing furnace, and repeating the process for multiple times to obtain a bismuth gallate ferroelectric film material with a required thickness. The material has a wide application prospect in the fields of photovoltaic solar cells, information storage and the like.

Description

Technical field [0001] The invention relates to a Bi-based oxide film material, specifically a BiGaO 3 Preparation method of component oxide ferroelectric thin film materials. Background technique [0002] Recently, it has been discovered that bismuth-based ferroelectric materials such as bismuth ferrite (BiFeO 3 ), bismuth titanate (Bi 4 Ti 3 O 12 ), bismuth aluminate (BiAlO 3 ) And other perovskite or pseudo-perovskite structure ferroelectric oxides have the characteristics of small leakage, strong anti-fatigue properties, large dielectric constant and environmental friendliness, etc., and have attracted much attention. In recent years, people’s interest in bismuth ferrite (BiFeO 3 ) And bismuth titanate (Bi 4 Ti 3 O 12 ) Design, preparation, physical and chemical properties and applications in production and life have a general knowledge and understanding. In 2005, Baettig et al. theoretically predicted bismuth gallate (BiGaO 3 ) Also has excellent ferroelectric properties,...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): C01G29/00
Inventor 张金中沈育德李亚巍胡志高孟祥建褚君浩
Owner EAST CHINA NORMAL UNIV