Multi-vision defect detecting equipment and method for large-size LCD glass substrate in production line

Abstract

The invention discloses a multi-vision defect detecting equipment and a multi-vision defect detecting method for a large-size LCD glass substrate in a production line. For the equipment, a linear scanning imaging detection system is adopted for acquiring the high-definition gray image of an LCD glass substrate to be detected, and the equipment is simple in structure and convenient to operate; according to the method disclosed by the invention, the acquired image is processed, a kmeans clustering method is adopted to carry out defect existence judgment on the processed image of the LCD glass substrate, and by making the defect regions, the defect category is judged by a classification method of a support vector machine (SVM), and the defect quantity is counted. Processed image and detection results are transmitted to an office in real time by a filed bus control system for operators on duty to check, and the field production parameters are transmitted, so that remote monitoring of the system is realized.

Description

technical field [0001] The invention belongs to the field of visual inspection equipment on an electronic manufacturing production line, and in particular relates to a multi-visual defect inspection equipment and method for a large-size LCD glass substrate on a production line. Background technique [0002] With the development of electronic technology, the price of consumer electronic products is getting lower and lower, and people's demand for electronic products continues to expand, which also drives the development of LCD glass substrate manufacturing. However, in order to pursue a more perfect audio-visual enjoyment, the mainstream sizes of LCD monitors, LCD TVs and mobile terminals are constantly expanding, and even some super-sized LCD screens will appear. Therefore, the production of large-size LCD glass substrates will be a turning point for the rapid development of the industry in the future. However, the quality inspection technology of large-size LCD glass subst...

AI Technical Summary

Problems solved by technology

The defects of manual detection are: 1. The detection speed is slow, the efficiency is low, and it cannot meet the needs of high-speed automatic production lines; 2. The detection accuracy is low, the detection quality is affected by human factors, and the probability of false detection and missed detection is high; 3. The labor intensity of workers Large, poor working environment; 4. It is inconvenient to save and query the test data, and it is not easy to manage

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