Multi-vision defect detecting equipment and method for large-size LCD glass substrate in production line

A glass substrate and defect detection technology, which is used in measurement devices, material analysis by optical means, instruments, etc., can solve the problems of inconvenient storage and query of detection data, poor working environment, and low detection accuracy.

Active Publication Date: 2014-07-09
HUNAN UNIV
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  • Abstract
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Problems solved by technology

The defects of manual detection are: 1. The detection speed is slow, the efficiency is low, and it cannot meet the needs of high-speed automatic production lines; 2. The detection accuracy is low, the detection quality is affected by

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  • Multi-vision defect detecting equipment and method for large-size LCD glass substrate in production line
  • Multi-vision defect detecting equipment and method for large-size LCD glass substrate in production line
  • Multi-vision defect detecting equipment and method for large-size LCD glass substrate in production line

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Embodiment Construction

[0070] The present invention will be described in further detail below in conjunction with specific examples and accompanying drawings.

[0071] Aiming at the deficiencies of the existing detection technology, the invention provides a multi-visual defect detection device and method for large-size LCD glass substrates on a production line.

[0072] A multi-vision defect detection equipment for large-size LCD glass substrates on a production line, including an imaging detection system and a bus control system;

[0073] Wherein, the imaging detection system includes at least two line scan cameras 11 installed side by side, one or more LED line light sources 12, a transmission control device 13 and a detection computer 14;

[0074] The transmission control device 13 includes a conveyor belt 131, a contact sensor 132, a PLC 133 and a PLC interactive display unit 134;

[0075] The touch sensor 132, the PLC 133 and the PLC interactive display unit 134 are connected in sequence; the ...

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Abstract

The invention discloses a multi-vision defect detecting equipment and a multi-vision defect detecting method for a large-size LCD glass substrate in a production line. For the equipment, a linear scanning imaging detection system is adopted for acquiring the high-definition gray image of an LCD glass substrate to be detected, and the equipment is simple in structure and convenient to operate; according to the method disclosed by the invention, the acquired image is processed, a kmeans clustering method is adopted to carry out defect existence judgment on the processed image of the LCD glass substrate, and by making the defect regions, the defect category is judged by a classification method of a support vector machine (SVM), and the defect quantity is counted. Processed image and detection results are transmitted to an office in real time by a filed bus control system for operators on duty to check, and the field production parameters are transmitted, so that remote monitoring of the system is realized.

Description

technical field [0001] The invention belongs to the field of visual inspection equipment on an electronic manufacturing production line, and in particular relates to a multi-visual defect inspection equipment and method for a large-size LCD glass substrate on a production line. Background technique [0002] With the development of electronic technology, the price of consumer electronic products is getting lower and lower, and people's demand for electronic products continues to expand, which also drives the development of LCD glass substrate manufacturing. However, in order to pursue a more perfect audio-visual enjoyment, the mainstream sizes of LCD monitors, LCD TVs and mobile terminals are constantly expanding, and even some super-sized LCD screens will appear. Therefore, the production of large-size LCD glass substrates will be a turning point for the rapid development of the industry in the future. However, the quality inspection technology of large-size LCD glass subst...

Claims

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Application Information

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IPC IPC(8): G01N21/896G01N35/00H04L29/06
Inventor 王耀南李力段峰陈铁健吴成中
Owner HUNAN UNIV
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