Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Successive approximation analog-digital converter and conversion method thereof

一种模数转换器、逐次逼近的技术,应用在模/数转换、代码转换、仪器等方向,能够解决输出码中7和8丢失等问题

Active Publication Date: 2014-07-16
CHONGQING GIGACHIP TECH CO LTD
View PDF6 Cites 28 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0012] It can be seen that 7 and 8 in the output code are lost

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Successive approximation analog-digital converter and conversion method thereof
  • Successive approximation analog-digital converter and conversion method thereof
  • Successive approximation analog-digital converter and conversion method thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0099] refer to figure 1 , the present embodiment successive approximation analog-to-digital converter includes: a segmented multi-stage capacitor array 11 with redundant bits, a comparator 12, a weight storage circuit 13, a code reconstruction circuit 14 and a control logic circuit 15.

[0100] Its working principle is: the external input signals Vin+ and Vin- are sent to the segmented multi-stage capacitor array 11 with redundant bits, the control logic circuit 15 controls the segmented multi-stage capacitor array 11 with redundant bits to sample the input signal, and Generate output voltages Vout+ and Vout-, send them to comparator 12 for comparison, control the capacitor switches in the segmented multi-stage capacitor array with redundant bits sequentially according to the output results of comparator 12, regenerate output voltages Vout+ and Vout-, and send them to Comparing to the comparator 12, and so on, until the control switch of the last group of capacitors is reset...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a successive approximation analog-digital converter and a conversion method thereof. The successive approximation analog-digital converter comprises a subsection multi-level capacitor array with a redundancy bit, a comparator, a weight storage circuit, a coding rebuilding circuit and a control logic circuit. The successive approximation analog-digital converter can reduce complexity of circuit design, save the layout area and power consumption, and accurately measure capacitor mismatch errors and conduct capacitor mismatch error correction without auxiliary capacitor arrays, auxiliary switches and control logics.

Description

technical field [0001] The present invention relates to the technical field of analog-to-digital converters, more precisely to a successive approximation analog-to-digital converter and a conversion method thereof. Background technique [0002] A successive approximation analog-to-digital (A / D, Analog to Digital) converter usually includes a capacitor array, and the accuracy of the array determines the accuracy of the successive approximation A / D converter. In the realization of the successive approximation A / D converter, three problems will be encountered: [0003] (1) Structural issues: [0004] (a) If the capacitor array adopts a single-segment structure, the required number of unit capacitors is: [0005] 2 N s - - - ( 1 ) [0006] where N s is the accuracy of the A / D converter, it can be seen that the number of unit ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): H03M1/38
CPCH03M1/0678H03M1/1061H03M1/468H03M1/687H03M1/0675H03M1/1245H03M1/42
Inventor 李婷李儒章张勇黄正波陈光炳王健安王育新付东兵王妍王旭
Owner CHONGQING GIGACHIP TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products