Reflecting internal storage network node card shared storage zone data mapping error rate testing method

A reflective memory network and bit error rate testing technology, which is applied in the field of computer communication, can solve the problems of no unified comprehensive method and inability to test node cards

Inactive Publication Date: 2014-07-30
BEIHANG UNIV +1
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  • Abstract
  • Description
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  • Application Information

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Problems solved by technology

However, there is no unified and effective comprehensive method for the test of reflective memory network at present. In most cases, only PRBS2 can be used. 7 The -1 code tests the node card's own physical l...

Method used

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  • Reflecting internal storage network node card shared storage zone data mapping error rate testing method
  • Reflecting internal storage network node card shared storage zone data mapping error rate testing method
  • Reflecting internal storage network node card shared storage zone data mapping error rate testing method

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Embodiment Construction

[0046] The specific embodiment of the method for testing the bit error rate of data mapping in the shared storage area of ​​a reflective memory network node card of the present invention is a testing program. The test program is written and compiled into executable files using C# programming language and Visual Studio2005 development tools.

[0047] In order to test the test effect of the method proposed in this patent application, a certain type of reflective memory network node card is selected as the implementation object. The host operating system of each node card is Windows XP, and the development platform is .NET Framework2.0. The hardware resources of the reflective memory network include a 32MByte shared storage area and user-defined interrupt events. The node card also provides a reflective memory network node card function encapsulation class RfmCard, whose members are shown in the following table.

[0048] Table 1

[0049] Function

RfmCard class me...

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Abstract

A reflecting internal storage network node card shared storage zone data mapping error rate testing method comprises fourteen steps. Comprehensive testing can be carried out on a local storage zone reading-writing link, a bottom layer network protocol firmware processing link and a physical layer transmitting-receiving link in a shared storage zone data mapping process of all node cards in a reflecting internal storage network. Accurate error rate parameter indexes can be obtained in real time, and a text-form testing report can be given. Data for testing used in the method are abundant in changing and high in randomness, a reflecting internal storage network practical working situation can be better simulated, and higher reliability is achieved. Testing is started by a testing sending node card, all the node cards in the whole network can be tested at the same time, covering performance is good, testing efficiency is greatly improved, and time consumed during testing is effectively shortened.

Description

technical field [0001] The invention relates to a method for testing the bit error rate of data mapping in a shared storage area of ​​a reflective memory network node card. The testing method can be used for the local storage area reading and writing links in the process of mapping all node cards in a reflective memory network to the shared storage area data. The processing link of the underlying network protocol firmware and the physical layer transceiver link are comprehensively tested. Not only can the accurate bit error rate parameter indicators be obtained in real time, but also the test report in the form of text can be given. The invention belongs to the fields of computer communication, computer aided testing and automatic testing. Background technique [0002] Reflective memory network (or called: real-time reflective memory network, English called: reflective memory systems) is a high-speed real-time network that allows computers with different bus structures and ...

Claims

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Application Information

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IPC IPC(8): H04L12/26H04L29/08
Inventor 周强张秀磊许海熊良永李景权
Owner BEIHANG UNIV
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