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Lamp filament testing device

A test device and filament technology, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of high efficiency, low power consumption, and small size, and achieve the effects of high efficiency, low power consumption, and small size

Active Publication Date: 2014-08-13
CHENGDU GUOGUANG ELECTRIC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] In the production process of microwave electric vacuum devices, to understand the product quality of microwave electric vacuum devices, it is necessary to measure microwave electric vacuum devices to obtain accurate parameter indicators. In some products, in order to understand its quality, it is necessary to know the electrical parameters of the filament of the cathode, and it is necessary to measure the technical indicators of the current, voltage and working time of the filament when the product is working. So far, there is no ready-made instrument that can It is a device for directly measuring the current, voltage and working time of the filament of the cathode of the electric vacuum device, not to mention the wide test range, accurate and reliable measurement results, sensitive control, convenient operation, automatic work can be set, small size and power consumption Low efficiency, high efficiency, etc., are currently used in actual use, especially in the testing and use of electric vacuum devices.

Method used

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Embodiment 1

[0024] see figure 1 , figure 1 The filament testing device provided by the embodiment of the present invention includes a DC power supply 1, an AC power supply 2, an ammeter, a voltmeter, a 100:1 current transformer, a shaping circuit, an amplifying circuit, a time control circuit, and a counting circuit .

[0025] The time control circuit includes a first JS48S device and a second JS48S device, pin 7 of the first JS48S device is connected to the positive pole of DC power supply 1, pin 2 of the first JS48S device is connected to pin 1 of the second JS48S device, pin 1 of the second JS48S device is Pin 1 of a JS48S device is connected to pin 6 of the counting circuit DH48J device, pin 4 of the first JS48S device is connected to the filament, pin 3 of the first JS48S device is empty, pin 8 of the first JS48S device is connected to pin 2 of the second JS48S device Pin, pin 6 of the first JS48S device is grounded, pin 5 of the first JS48S device is empty; pin 7 of the second JS4...

Embodiment 2

[0031] The technical solution of the second embodiment is basically the same as that of the first embodiment. The difference between the two is that the amplifying circuit described in the second embodiment is an integrated operational amplifier circuit, and in the filament testing device, the integrated operational amplifier circuit adopts an inverse proportional amplifier. The inverting input terminal of the proportional amplifier is connected with the output terminal of the shaping circuit, and receives the output signal of the shaping circuit; the inverting output terminal of the proportional amplifier is connected with the time control circuit, and outputs an amplified control signal to the time control circuit.

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Abstract

The invention discloses a lamp filament testing device. The lamp filament testing device comprises a direct-current power source 1, an alternating-current power source 2, an ampere meter, a voltage meter, an instrument transformer, a shaping circuit, an amplification circuit, a time control circuit and a counting circuit. By the adoption of the lamp filament testing device, the current, the voltage and the work time of a lamp filament of the cathode of an electrical vacuum device can be directly measured, the testing range is wide, measurement results are accurate and reliable, control is sensitive, operation is convenient, automatic work can be achieved through setting, the size is small, power consumption is low and efficiency is high.

Description

technical field [0001] The invention relates to a testing device, in particular to a filament testing device. Background technique [0002] In the production process of microwave electric vacuum devices, to understand the product quality of microwave electric vacuum devices, it is necessary to measure microwave electric vacuum devices to obtain accurate parameter indicators. For example, electric vacuum devices such as traveling wave tubes and magnetrons have cathodes In some products, in order to understand its quality, it is necessary to know the electrical parameters of the filament of the cathode, and it is necessary to measure the technical indicators of the current, voltage and working time of the filament when the product is working. So far, there is no ready-made instrument that can It is a device for directly measuring the current, voltage and working time of the filament of the cathode of the electric vacuum device, not to mention the wide test range, accurate and ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 周建一夏晓明
Owner CHENGDU GUOGUANG ELECTRIC