Measuring point selection method in analog circuit fault diagnosis

A technology for simulating circuit faults and measuring points, which is applied in the direction of analog circuit testing, electronic circuit testing, electrical digital data processing, etc., to achieve the effect of small algorithm complexity and high efficiency

Inactive Publication Date: 2014-10-08
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0015] This encoding technique is simple to implement, but has two defects: one is to set the variation range of all fault voltages on all measuring points as a fixed range (such as the commonly

Method used

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  • Measuring point selection method in analog circuit fault diagnosis
  • Measuring point selection method in analog circuit fault diagnosis
  • Measuring point selection method in analog circuit fault diagnosis

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Embodiment

[0098] Figure 4 is the circuit diagram under test of the embodiment. Such as Figure 4 As shown, the circuit under test in this embodiment is a band-pass filter. In this embodiment, it is assumed that the tolerance ranges of the resistance and capacitance components are α R =±5% and α C =±5%. Excite the circuit with a sinusoidal signal with a frequency of 300 Hz and an amplitude of 1 V. t 1 , t2 , t 3 Represents three alternative measurement points. Monte Carlo simulations are carried out for 11 fault states, and the measured data are voltage values. For the convenience of description, the number of times of Monte Carlo simulation MC=10 is set in this embodiment. Table 5 is the measuring point t 1 The simulated voltage value.

[0099]

[0100]

[0101] table 5

[0102] Table 6 is the measuring point t 2 The simulated voltage value.

[0103]

[0104] Table 6

[0105] Table 7 is the measuring point t 3 The simulated voltage value.

[0106]

[0107] ...

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Abstract

The invention discloses a measuring point selection method in analog circuit fault diagnosis. The method includes the steps that firstly, in a preset tolerance range, fault analog simulation is conducted on a circuit, so that measured data of measuring points of faults are obtained; then, the measuring points are selected through a measuring point selection algorithm based on heuristic mode graph searching, root nodes are initialized firstly and serve as target nodes, all the measuring points in a measuring point set are adopted as successor nodes to expand the target node, simulation data of one measuring point corresponding to each successor node are screened according to data identification, fuzzy groups are divided according to screened address data, the probability of occurrence of the fuzzy groups is obtained, information entropy of each successor node is calculated, the node with the smallest information entropy is selected as the optimal node and deleted from the measuring point set, and the optimal node serves as a target node and is expanded continuously until the information entropy is zero or the measuring point set is empty. According to the method, the measuring points can be preferably selected, so that an optimal measuring point selection scheme is obtained, and fault diagnosis is achieved through fewer measuring points.

Description

technical field [0001] The invention belongs to the technical field of fault diagnosis of analog circuits, and more specifically relates to a method for selecting measuring points in fault diagnosis of analog circuits. Background technique [0002] The fault dictionary technology belongs to the pre-test simulation method, and is currently a relatively effective fault diagnosis method for analog circuits. The problem of measuring point selection of fault dictionary has been widely concerned, and practice has proved that the integer coding method is an effective tool for measuring point selection. Integer coding technology comes from the concept of fuzzy group. Hochwald et al. first proposed the concept of fuzzy group in their literature. For any given node, there may be many fault signals (such as voltage value, etc.) generated on this node are very small. so that these failures are indistinguishable on this node. These failures are said to belong to the same fuzzy group. ...

Claims

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Application Information

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IPC IPC(8): G01R31/316G06F19/00
Inventor 杨成林田书林刘震龙兵周秀云
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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