Measuring point selection method in analog circuit fault diagnosis
A technology for simulating circuit faults and measuring points, which is applied in the direction of analog circuit testing, electronic circuit testing, electrical digital data processing, etc., to achieve the effect of small algorithm complexity and high efficiency
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[0098] Figure 4 is the circuit diagram under test of the embodiment. Such as Figure 4 As shown, the circuit under test in this embodiment is a band-pass filter. In this embodiment, it is assumed that the tolerance ranges of the resistance and capacitance components are α R =±5% and α C =±5%. Excite the circuit with a sinusoidal signal with a frequency of 300 Hz and an amplitude of 1 V. t 1 , t2 , t 3 Represents three alternative measurement points. Monte Carlo simulations are carried out for 11 fault states, and the measured data are voltage values. For the convenience of description, the number of times of Monte Carlo simulation MC=10 is set in this embodiment. Table 5 is the measuring point t 1 The simulated voltage value.
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[0101] table 5
[0102] Table 6 is the measuring point t 2 The simulated voltage value.
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[0104] Table 6
[0105] Table 7 is the measuring point t 3 The simulated voltage value.
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