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A test method for on-resistance of 16-channel analog switch circuit

A technology of simulating switching circuit and on-resistance, applied in the field of testing on-resistance of 16-channel analog switching circuit, which can solve the problems of many devices, complex structure, lack of objectivity, etc.

Active Publication Date: 2016-11-09
EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] Due to the fact that the test system built with discrete devices uses many devices in the traditional analog switch on-resistance test, there are problems such as complex structure, low test accuracy, insufficient objectivity, and insufficient accuracy during use.

Method used

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  • A test method for on-resistance of 16-channel analog switch circuit
  • A test method for on-resistance of 16-channel analog switch circuit
  • A test method for on-resistance of 16-channel analog switch circuit

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Embodiment Construction

[0063] The present invention will be further described below in conjunction with the accompanying drawings.

[0064] Such as figure 1 As shown, a method for testing the conduction resistance of a 16-channel analog switch circuit comprises the following steps, wherein the chip of the 16-channel analog switch circuit is AD7506,

[0065] S01, building a test module: building DVI boards DVI_11, OVI boards OVI_1 and MUX boards, the DVI boards and OVI boards are used to provide test power, ground level and high and low levels;

[0066] DVI board DVI_11 includes DVI first channel CH00 and DVI second channel CH01, said DVI first channel CH00 and DVI second channel CH01 output two sets of DC programmable voltage and current sources to provide the positive and negative power supply +15V and - required by the circuit 15V;

[0067] The OVI board OVI_1 outputs 8-channel voltage and current sources and voltage and current measurement units to provide the input terminal voltage and control...

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Abstract

The invention discloses a method for testing the on-resistance of a 16-channel analog switch circuit. The on-resistance of the analog switch refers to the resistance between the two ends of the switch when the analog switch is turned on. During the test, the enable terminal is connected to a high level Or a low level to turn on the switch. Then apply a DC level of +10V or -10V to the input end of the switch, and connect a resistor R to the ground at the other end. By measuring the potential at the output end of the switch, the on-resistance value RON of the analog switch can be obtained by calculation. The present invention can measure 16 Channel analog switch circuit conduction resistance, integrated test platform, simple structure, high test efficiency, 16-channel analog switch input terminals VS1~VS16 are tested with +10V and -10V voltages, a total of 32 combinations, the entire test process only needs After 2‑3 seconds, the on-resistance values ​​RON1~RON32 are tested together.

Description

technical field [0001] The invention relates to the field of testing the on-resistance of an analog switch, in particular to a method for testing the on-resistance of a 16-channel analog switch circuit. Background technique [0002] The on-resistance of the analog switch refers to the resistance between the two ends of the switch when the analog switch is turned on. During the test, the enable terminal is connected to a high level or a low level to make the switch conduction. Then apply a DC level of +10V or -10V to the switch input terminal VS, and connect a resistor R to the ground at the other end. By measuring the potential VD of the switch output terminal, the on-resistance value RON of the analog switch can be calculated. The traditional analog switch conduction The on-resistance test design is divided into four parts: power supply part, control part, intelligent part and acquisition part. [0003] Power supply part: regulated power supply ±17V input, the output is r...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/14
Inventor 王丽
Owner EAST CHINA INST OF OPTOELECTRONICS INTEGRATEDDEVICE