Test device for surface mount device tuning fork crystals
A technology of tuning fork crystal and testing device, which is applied in the direction of measuring device, measuring electricity, measuring electrical variables, etc., can solve the problems of difficult manual operation and low efficiency, and achieve the effects of simple structure, high production efficiency and convenient use.
Pending Publication Date: 2014-12-10
HUBEI TKD ELECTRONICS TECH
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Problems solved by technology
[0003] The purpose of the present invention is to overcome the problems of difficult manual operation and low efficiency when testing the electrical parameters of the two electrodes of the patch tuning fork crystal in the prior art, and to provide a patch tuning fork crystal with simple structure, convenient use and high testing efficiency. Testing device for a tuning fork crystal
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Embodiment Construction
[0016] The present invention will be further described below in conjunction with accompanying drawing.
[0017] see Figure 1 to Figure 2 , a testing device for patch tuning fork crystals, including a testing machine 1 and a component chuck 2, the testing machine 1 includes a frame 11, a test shrapnel 12, a sliding table cylinder 13 is arranged on the frame 11, and the testing shrapnel 12 passes through The mounting frame 14 is connected with the sliding table cylinder 13. The component chuck 2 is arranged on the lower side of the testing machine 1. The component chuck 2 consists of the component placement plate 3, the first pumping plate 4 and the second pumping plate arranged in sequence from top to bottom. The component placement plate 3 is provided with a placement through hole 31 for placing the patch tuning fork crystal, the middle position is provided with a fixing hole 32, and the No. 1 pumping board 4 is provided with a No. 1 through hole 41 corresponding to the place...
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A test device for surface mount device tuning fork crystals comprises a test machine and an element chuck. The test machine comprises a rack and an elastic test piece, a sliding table cylinder is arranged on the rack, the elastic test piece is connected with the sliding table cylinder through a mounting rack, the element chuck is arranged on the lower side of the test machine and composed of an element holding plate, a first pulling plate and a second pulling plate arranged sequentially from bottom to top, holding through holes used for holding the surface mount device tuning fork crystals are arranged in the element holding plate, a fixing hole is arranged in the middle of the element holding plate, a first hollow sliding slot is arranged in the position, corresponding to the fixing hole, of the first pulling plate horizontally, a groove corresponding to the first through hole is arranged in the second pulling plate, a horizontal second hollow sliding slot is arranged in the position, corresponding to the fixing hole, of the second pulling plate, and the element holding plate, the first pulling plate and the second pulling plate are fixed through a bolt penetrating the fixing hole, the first hollow sliding slot and the second hollow sliding slot as well as a nut.
Description
technical field [0001] The invention relates to an automatic production equipment for the production of a patch tuning fork crystal, in particular to a testing device for a patch tuning fork crystal. Background technique [0002] In the field of SMD crystal production, it is necessary to test the electrical parameters of the produced SMD tuning fork crystal. Since the size of the SMD tuning fork crystal is very small, only a few millimeters, the two electrodes used for welding are even smaller, which is very difficult for the human eye. Difficult to align, it is quite difficult to use manual operation, and the efficiency is low. Contents of the invention [0003] The purpose of the present invention is to overcome the problems of difficult manual operation and low efficiency when testing the electrical parameters of the two electrodes of the patch tuning fork crystal in the prior art, and to provide a patch tuning fork crystal with simple structure, convenient use and high...
Claims
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IPC IPC(8): G01R31/00
Inventor 许玉清李文双晏天忠
Owner HUBEI TKD ELECTRONICS TECH