A Time Domain Dynamic Correction Method for Cable Measurement Error in Temperature Test

A temperature test and measurement error technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of low temperature limit, complicated calibration method, and long calibration time, so as to achieve no increase in test cost and true test results accurate effect

Active Publication Date: 2016-09-21
XIAN INSTITUE OF SPACE RADIO TECH
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Problems solved by technology

The advantage of this method is real real-time compensation calibration. The disadvantage is the accuracy of the temperature data of the calibration piece. The calibration method when the calibration period of the automatic calibration piece itself expires is complicated and the calibration takes a long time. Moreover, the electronic switch and the calibration piece The lower temperature limit given is often not high enough, such as -40°C or even -25°C

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  • A Time Domain Dynamic Correction Method for Cable Measurement Error in Temperature Test
  • A Time Domain Dynamic Correction Method for Cable Measurement Error in Temperature Test
  • A Time Domain Dynamic Correction Method for Cable Measurement Error in Temperature Test

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Embodiment Construction

[0040] The specific embodiments of the present invention will be described in detail below with reference to the accompanying drawings.

[0041] like figure 2 Shown is a schematic diagram of the cable connection relationship between the test instrument and the DUT. figure 2 It can be known that when the temperature test is performed, the device under test (the cable under test) is placed inside the thermostat, and is connected to the device under test through the upstream test cable and the downstream test cable.

[0042] like figure 1 Shown is an inventive flow chart of the present invention, consisting of figure 1 It can be seen that the time domain dynamic correction method for cable measurement error in a temperature test provided by the present invention, the steps are as follows:

[0043] (1) Calibrate the vector network analyzer used in the temperature test before connecting the tested product to eliminate the internal error of the vector network analyzer;

[0044...

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Abstract

The invention discloses a time-domain dynamic correction method for cable measurement errors in a temperature test. When radio frequency microwave products are tested in a laboratory, radio frequency cables are needed to be used for connecting the detected products with instruments. In order to guarantee accuracy of a product test, the cables must be tested singly before usage to obtain characteristic parameters of the cables, and errors introduced by the cables are corrected in a test system. But when the detected products enter a temperature chamber for a high-low temperature cycling test, the characteristic parameters of the radio frequency cables change along with high and low temperatures, and furthermore, the cables are already connected with the detected products and the instruments in the temperature chamber, single correction can not be carried out, so accuracy of the product test is lowered. By the aid of the method, a problem that the radio frequency test cables can't be tested during temperature cycling is solved, the real-time characteristic parameters of the radio frequency cables in a high-low temperature chamber can be acquired, the acquired cable parameters are used for correcting a test result, and accurate product test in a temperature cycling test can be achieved.

Description

technical field [0001] The invention relates to a time-domain dynamic correction method for cable measurement error in temperature test, realizes accurate test of satellite payload part and component products in temperature cycle test, corrects the error influence caused by testing connecting cable, and is suitable for various Satellite-like payload section, precise testing of component product temperature cycling. Background technique [0002] The satellite payload department and component products usually need to undergo a temperature cycle test. The purpose is to monitor whether the satellite payload department and component products work normally under the temperature alternating environment, and whether the technical indicators meet the overall requirements, so as to ensure the normal performance of the satellite in orbit. . In the microwave payload department, when the component products are subjected to temperature cycle tests, high-frequency test cables are often us...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/00G01R25/00G01R27/26
Inventor 王伟朱宜东李新雷王学科杨晓敏左刚谢静
Owner XIAN INSTITUE OF SPACE RADIO TECH
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