FPGA-based (field programmable gate array based) PCIE (peripheral component interface express) data collection device with self-checking correcting function and data collection method thereof

Abstract

The invention relates to an FPGA-based (field programmable gate array based) PCIE (peripheral component interface express) data collection device with a self-checking correcting function and a data collection method thereof and solves the technical problems such that the existing data collection device is low in speed, precision, signal-to-noise ratio and capacity and has no self-checking function. The device comprises an analog signal input interface, a changeover switch, a DAC (digital-to-analog converter), a primary filter unit, a differential amplifier unit, an ADC (analog-to-digital converter), a clock unit and an FPGA unit; the changeover switch is connected with the analog signal input interface; the primary filter unit is connected with the changeover switch; the differential amplifier unit is connected with the primary filter unit; the ADC is connected with the differential amplifier unit; the FPGA unit is connected with the ADC; the DAC is connected with the changeover switch; the FPGA unit is connected with the DAC. The device and the method are widely applicable to data collection of testing and measuring equipment.

Description

technical field [0001] The invention relates to a data acquisition device and a data acquisition method, in particular to an FPGA-based PCIE data acquisition device and a method with a self-checking and correcting function. Background technique [0002] The core part of the test and measurement equipment is the data acquisition device. A high-quality acquisition device can provide more realistic on-site data for the test and measurement equipment. [0003] Existing data acquisition devices generally use a microprocessor as the main control module to control ADC acquisition and other peripheral functional circuits. The structure is relatively simple. Such acquisition devices mainly have the following technical defects: [0004] (1) Without self-test and correction function, it cannot accurately eliminate the zero point and gain errors of the device itself; [0005] (2) The noise suppression ability of the device itself is weak, and the signal-to-noise ratio is relatively low...

AI Technical Summary

Problems solved by technology

[0008] The present invention aims to solve the technical problems of the existing data acquisition devices such as low speed, low precision, low signal-to-noise ratio, small capacity, and no self-checking and correcting function, and provides a high-speed, high-precision, high signal-to-noise ratio, large-capacity, FPGA-based PCIE data acquisition device and method with self-checking and correcting function capable of real-time acquisition

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