Oblique incidence high-reflection film laser electric field distribution design method
A high-reflection film and design method technology, applied in optics, optical components, instruments, etc., can solve problems such as inability to optimize electric field distribution
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment
[0044] The basic structure of the film is as described above. The following is an example design for a 632.8nm laser film, the incident angle is 45°, and the polarization state is S polarization:
[0045] 1. High-reflection film structure design steps:
[0046] 1) Set the wavelength of the laser to 632.8nm, the working angle to 45°, and the high refractive index material to be Ta 2 o 5 , the low refractive index material is SiO 2 ; The refractive indices of high refractive index and low refractive index film materials are respectively n H = 2.10 and n L =1.47; the extinction coefficients of high refractive index and low refractive index film materials are k respectively H =2×10 -5 and k L =1×10 -6 ;
[0047] 2) The calculated optical thickness coefficients of the high refractive index and low refractive index films are α=1.0620 and β=1.1406, respectively;
[0048] 3) Set the basic period of the film as m=17; then the corrected film structure is: substrate / (1.062H 1.1...
PUM
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com