Method and system for extracting abnormal parameters of brain
An abnormal parameter, brain technology, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve the problem of difficult to extract and sensitively reflect abnormal brain structure and function.
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[0068] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0069] Such as figure 1 As shown, in one embodiment, a method for extracting abnormal brain parameters is provided, the method comprising:
[0070] Step 101 , performing magnetic resonance diffusion tensor imaging and resting state functional imaging scans on the brain to obtain diffusion tensor data and resting state functional data of the brain. In this embodiment, the diffusion tensor data (DTI) and resting-state functional data (Resting-state fMRI) of the brain can be obtained by performing magnetic resonance scanning on the patient's brain through the magnetic resonance scanner.
[0071] Ste...
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