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Method and system for extracting abnormal parameters of brain

An abnormal parameter, brain technology, applied in electrical digital data processing, special data processing applications, instruments, etc., can solve the problem of difficult to extract and sensitively reflect abnormal brain structure and function.

Inactive Publication Date: 2015-02-11
SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI
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Problems solved by technology

[0004] By extracting the abnormal parameters of the brain, it is possible to diagnose whether the patient has AD in advance. At present, most of the AD research methods based on the brain network at home and abroad separate the function and structure of the brain for research, so that the traditional extraction of abnormal brain parameters It is difficult to extract parameters that sensitively reflect brain structure and function abnormalities

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  • Method and system for extracting abnormal parameters of brain
  • Method and system for extracting abnormal parameters of brain
  • Method and system for extracting abnormal parameters of brain

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Embodiment Construction

[0068] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0069] Such as figure 1 As shown, in one embodiment, a method for extracting abnormal brain parameters is provided, the method comprising:

[0070] Step 101 , performing magnetic resonance diffusion tensor imaging and resting state functional imaging scans on the brain to obtain diffusion tensor data and resting state functional data of the brain. In this embodiment, the diffusion tensor data (DTI) and resting-state functional data (Resting-state fMRI) of the brain can be obtained by performing magnetic resonance scanning on the patient's brain through the magnetic resonance scanner.

[0071] Ste...

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Abstract

The invention provides a method and system for extracting abnormal parameters of the brain. The method comprises the following steps: carrying out magnetic resonance diffusion tensor imaging and resting-state functional imaging scanning for the brain, and obtaining diffusion tensor data and resting-state functional data of the brain; building the structural connection network of the brain according to the diffusion tensor data; building the functional connection network of the brain according to the resting-state functional data; coupling the structural connection network with the functional connection network to obtain network coupling indexes; arraying and verifying the network coupling indexes and normal network coupling indexes, and extracting the parameters which are different from the normal network coupling indexes in the network coupling indexes. The method and the system are used for conveniently extracting the parameters sensitively reflecting the abnormity of the structure and the function of the brain.

Description

technical field [0001] The invention relates to the technical field of magnetic resonance imaging, in particular to a method and system for extracting abnormal brain parameters. Background technique [0002] Alzheimer's disease (AD) is a primary neurodegenerative disease, with neurofibrillary tangles and amyloid deposition as the main pathological basis, speech impairment and memory loss as the main features, and finally develops into intellectual loss , unable to talk and eat, limb contractures, etc., increased family and social burden. At present, there is no effective treatment for AD. If good preventive and therapeutic measures can be given in the early stage of AD, the number and incidence of AD can be effectively controlled. Therefore, how to detect and diagnose AD patients early is particularly important. [0003] At present, AD research using brain network methods can be divided into two categories: one is to use structural magnetic resonance imaging, diffusion mag...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F19/00
Inventor 姜春香张丽娟隆晓菁刘新郑海荣
Owner SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI
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