Method for testing aging resistance of nitride fluorescent powder

A technology of nitride phosphors and testing methods, applied in fluorescence/phosphorescence, material excitation analysis, etc., can solve the problems of high testing cost and long time, and achieve the effect of reducing testing cost, speeding up aging process and saving aging time

Inactive Publication Date: 2015-03-18
NINGBO INST OF MATERIALS TECH & ENG CHINESE ACADEMY OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

The chemical properties of nitrides are more stable than oxides. If the conventional double 85 aging test is use

Method used

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  • Method for testing aging resistance of nitride fluorescent powder
  • Method for testing aging resistance of nitride fluorescent powder
  • Method for testing aging resistance of nitride fluorescent powder

Examples

Experimental program
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Effect test

reference example 1

[0042] Take a certain quality of CaAlSiN produced by manufacturer 1 3 :Eu 2+ Phosphor powder was dried in a vacuum oven for 1 hour at a drying temperature of 100°C. After cooling, take some samples and put them into quartz crucibles, put them into a double 85 aging box for aging, the aging conditions are humidity 85%, temperature 85 ℃, aging time is 3000 hours and 6000 hours respectively. After aging, the sample cooled to room temperature was taken out, and placed in a vacuum oven for 6 hours to vacuum dry at 60°C; after the sample was cooled, the sample cooled to room temperature was taken out. The relative intensity values ​​of the emission spectra of the phosphor powder before and after aging were tested respectively. The excitation wavelength during the test is 450nm, the accelerating voltage is 700V, the test scanning speed is 240nm / min, and the excitation and emission slits are both 0.2nm.

reference example 2

[0044] Take a certain quality of CaAlSiN produced by manufacturer 2 3 :Eu 2+Phosphor powder was dried in a vacuum oven for 1 hour at a drying temperature of 100°C. After cooling, take some samples and put them into quartz crucibles, put them into a double 85 aging box for aging, the aging conditions are humidity 85%, temperature 85 ℃, aging time is 3000 hours and 6000 hours respectively. After aging, the sample cooled to room temperature was taken out, and dried in a vacuum oven for 6 hours at a drying temperature of 60°C; after the sample was cooled, the sample cooled to room temperature was taken out. The relative intensity values ​​of the emission spectra of the phosphor powder before and after aging were tested respectively. The excitation wavelength during the test is 450nm, the accelerating voltage is 700V, the test scanning speed is 240nm / min, and the excitation and emission slits are both 0.2nm.

Embodiment 1

[0046] Take a certain quality of CaAlSiN produced by manufacturer 1 3 :Eu 2+ Phosphor powder was dried in a vacuum oven for 1 hour at a drying temperature of 100°C. After cooling, take some samples and put them into quartz crucibles, put them into the aging equipment 000 for aging, the aging conditions are 100% humidity, 210°C, and the aging time is 2 hours and 5 hours respectively. After aging, the sample cooled to room temperature was taken out, and placed in a vacuum oven for 6 hours to be vacuum-dried at 60° C.; the sample cooled to room temperature after drying was taken out. The relative intensity values ​​of the emission spectra of the phosphor powder before and after aging were tested respectively. The excitation wavelength during the test is 450nm, the accelerating voltage is 700V, the test scanning speed is 240nm / min, and the excitation and emission slits are both 0.2nm.

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Abstract

The invention provides a method for testing aging resistance of nitride fluorescent powder. The method comprises the following steps: putting the nitride fluorescent powder to be tested into a vacuum oven, and drying at the temperature of 40 DEG C-100 DEG C for 1-24h; cooling the nitride fluorescent powder after drying to room temperature; weighing a certain amount of the nitride fluorescent powder cooled to room temperature, and loading into a container; putting the container containing the nitride fluorescent powder into an aging device for aging for 1-24h, wherein the aging conditions are as follows: the humidity is 100%, and the temperature is more than 100 DEG C and less than 300 DEG C; cooling the nitride fluorescent powder after aging to room temperature; putting the nitride fluorescent powder after cooling into the vacuum oven, drying at the temperature of 40 DEG C-100 DEG C, and then cooling to room temperature; and testing the luminous intensity of the nitride fluorescent powder before and after aging to obtain relative intensity values before and after aging. Compared with a traditional method, by adopting the method for testing the aging resistance of the nitride fluorescent powder, provided by the invention, the aging time is shortened and the testing cost is reduced.

Description

technical field [0001] The invention relates to the aging of fluorescent powder, in particular to a method for testing the aging resistance of nitride fluorescent powder. Background technique [0002] At present, the double 85 aging test is often used to test the aging resistance of phosphors. The double 85 in the double 85 aging test specifically refers to the aging environment of the phosphor powder with a humidity of 85% and a temperature of 85°C. By testing the change of the luminous intensity of the phosphor powder before and after aging, the aging resistance of the phosphor powder is determined. For oxide phosphors, it takes at least 1000 hours to obtain the aging resistance of the phosphors. The chemical properties of nitrides are more stable than that of oxides. If the conventional double 85 aging test is used to test the aging resistance of nitride phosphors, it will take longer time, resulting in higher testing costs. Contents of the invention [0003] In orde...

Claims

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Application Information

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IPC IPC(8): G01N21/64
Inventor 解荣军周天亮
Owner NINGBO INST OF MATERIALS TECH & ENG CHINESE ACADEMY OF SCI
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