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Three-dimensional measurement method of fringe reflection based on binary fringe defocus

A three-dimensional measurement and fringe reflection technology, applied in measurement devices, instruments, optical devices, etc., can solve the problems of reducing measurement accuracy and blurring of deformed fringe images, filtering out high-order harmonics, improving projection speed, and overcoming gamma. effect of effect

Active Publication Date: 2017-09-01
SHANGHAI SUPORE INSTR
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AI Technical Summary

Problems solved by technology

In the previous method, when the CCD is focused on the measured object, the image of the sinusoidal fringe projected by the display is in a defocused state, so the image of the deformed fringe modulated by the height of the object is blurred, which reduces the measurement accuracy.

Method used

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  • Three-dimensional measurement method of fringe reflection based on binary fringe defocus
  • Three-dimensional measurement method of fringe reflection based on binary fringe defocus
  • Three-dimensional measurement method of fringe reflection based on binary fringe defocus

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Embodiment Construction

[0027] Embodiments of the present invention will be further described in detail below with reference to the accompanying drawings.

[0028] The present invention works and implements like this, the three-dimensional measurement method of fringe reflection based on binary fringe defocus is characterized in that it consists of three key parts: binary fringe coding principle, defocus projection system, and fringe reflection measurement principle.

[0029] 1. The principle of binary stripe coding

[0030] The computer-coded binary stripes only have two gray values ​​(0 and 255). When the input light intensity is 0 or 255, the output light intensity will not change. The light intensity distribution of the coded binary stripes is (such as image 3 shown):

[0031]

[0032] 2. Binary fringe out-of-focus projection

[0033] By performing a Fourier analysis on the binary fringes:

[0034]

[0035] The Fourier spectrum G(f) of g(x) x )yes:

[0036] G(f x ) = Csinc(f x / 2f ...

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Abstract

The invention discloses a three-dimensional measurement method for fringe reflection based on binary fringe defocus, which is composed of three key parts: a binary fringe coding principle, a defocus projection system, and a three-dimensional measurement principle for fringe reflection. The advantages of the present invention are: (1) This method utilizes the LED display to project binary stripes. Since there are only two gray levels of 0 and 255, the LED emits light in the form of a semiconductor light-emitting diode, so the projection speed of the LED display is greatly improved. Greatly improve the three-dimensional measurement speed; (2) Due to the method of binary fringe defocusing, the distance between the LED display and the reference plane can be increased, so the measurement range of the LED display is larger than that of the traditional LCD display. (3) The binary fringe defocus method is adopted to form sinusoidal fringes on the surface of the measured object, so that the CCD can focus on the measured object, and a clear deformed fringe image modulated by the height of the object can be captured. Improved measurement accuracy.

Description

technical field [0001] The invention relates to a mirror-like three-dimensional measurement method, in particular to a three-dimensional measurement method for fringe reflection based on binary fringe defocus. Background technique [0002] The fringe reflection three-dimensional measurement method is of great significance in three-dimensional measurement due to the advantages of non-contact, full-field measurement, fast measurement speed and easy information processing when measuring mirror-like objects. The three-dimensional measurement experimental device such as figure 1 As shown, it includes LED display 1, CCD camera 2, computer 3, workstation 4, reference plane 5 and object to be measured 6; LED display 1 projects stripes with characteristic information to reference plane 5, and CCD camera 2 collects stripe information , and get the reference phase after being processed by workstation 4. Then put the object to be measured 6 at the same position, get the corresponding ...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
Inventor 伏燕军张建成吴海涛李彪
Owner SHANGHAI SUPORE INSTR
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