Log similarity based failure processing method and device

A technology for dealing with faults and similarities, applied in electrical digital data processing, instruments, error detection/correction, etc., can solve problems such as manual diagnosis and judgment of system fault types

Active Publication Date: 2015-03-25
EMC IP HLDG CO LLC
View PDF2 Cites 28 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Usually, technical engineers analyze log files and judge and troubleshoot faults based on their own experience. These require manual diagnosis and cannot judge the fault type of the system in an automated manner.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Log similarity based failure processing method and device
  • Log similarity based failure processing method and device
  • Log similarity based failure processing method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] Preferred embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although preferred embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.

[0028] figure 1 A block diagram of an exemplary computing system 100 suitable for implementing embodiments of the invention is shown. Such as figure 1As shown, the computer system 100 may include: CPU (Central Processing Unit) 101, RAM (Random Access Memory) 102, ROM (Read Only Memory) 103, system bus 104, hard disk controller 105, keyboard controller 106, serial Interface controller 107 , parallel interface controller 108 , display contr...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a log similarity based failure processing method and device. In one implementation mode, the log similarity based failure processing method comprises the steps of making response to acquire multiple log files of at least one system having failures and extracting log modes from the multiple log files, wherein the log modes describe regular expressions corresponding to log messages in the log files in the multiple log files; utilizing the log modes to establish a mode memory bank; mapping each log file in the multiple log files to an n-dimensional vector; clustering multiple n-dimensional vectors where the multiple log files are mapped to at least one group, wherein each group in at least one group indicates one failure type of at least one system. In another implementation mode, the corresponding device is provided. By means of the log similarity based failure processing method and device, manual working amount during failure processing can be reduced.

Description

technical field [0001] Embodiments of the present invention relate to troubleshooting, and more particularly, to methods and apparatus for troubleshooting based on log similarity. Background technique [0002] With the increase in the complexity of computer hardware systems and the enhancement of software system functions, when running on different hardware systems, the operating environment faced by computer systems (including hardware and software, for example) is becoming more and more complex. At this time, the system may appear All sorts of glitches. For example, with the development of multi-core processor technology, more and more computing devices use one or more multi-core processors, which increases the possibility of processor failure; The system may also face other types of failures such as memory leaks. [0003] In various current application systems, there is usually a relatively complete log recording module, which can record various states of the hardware / s...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/34
CPCG06F11/079G06F11/0724
Inventor 付宇陈超王天青钟钱杰陈齐彦
Owner EMC IP HLDG CO LLC
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products